Kyushu Institute of Technology Academic Repository
Kyutacarは九州工業大学で生産された研究成果を オープンアクセスで提供する機関リポジトリシステムです。 Kyutacar is open-access repository of research by members of the Kyushu Institute of Technology.
Kyushu Institute of Technology/Japan Science and Technology Agency, CREST
Kyushu Institute of Technology/Japan Science and Technology Agency, CREST
Kyushu Institute of Technology/Japan Science and Technology Agency, CREST
Kyushu Institute of Technology/Japan Science and Technology Agency, CREST
Kyushu Institute of Technology/Japan Science and Technology Agency, CREST
抄録
Low-power test technology has been investigated deeply to achieve an accurate and efficient testing. Although many sophisticated methods are proposed for scan-test, there are not so many for logic BIST because of its uncontrollable randomness. However, logic BIST currently becomes vital for system debug or field test. This paper proposes a novel low power BIST technology that reduces shift-power by eliminating the specified high-frequency parts of vectors and also reduces capture power. The authors show that the proposed technology not only reduces test power but also keeps test coverage with little loss.
内容記述
2012 IEEE 21st Asian Test Symposium, 19-22 Nov. 2012, Niigata, Japan
雑誌名
Asian Test Symposium (ATS), 2012 IEEE 21th
ページ
173 - 178
発行年
2012-12-31
出版者
IEEE
ISSN
1081-7735
1081-7735
DOI
info:doi/10.1109/ATS.2012.27
権利
Copyright (c) 2012 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Low Power BIST for Scan-Shift and Capture Power
ats_173_178.pdf
(550.3KB)
