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Kyushu Institute of Technology, Japan
Kyushu Institute of Technology, Japan
Kyushu Institute of Technology, Japan
抄録
An on-chip digital sensor using three types of ring oscillators (ROs: Ring Oscillators) has been proposed to measure temperature and voltage of a VLSI. Each RO has inherent frequency characteristics with respect to temperature and voltage, which differ from those of the other two ROs. Measurement accuracy of the sensor depends on the combination of the ROs. This paper proposes a RO-selection method for the sensor with high accuracy. The proposed method takes particular note of temperature or voltage sensitivity as well as linearity of the RO characteristics. Evaluation experiments with SPICE simulation in 65 nm CMOS technology show that the temperature and voltage accuracies of the sensor are 2.744°C and 3.825mV, respectively, and the selected combination was a nearly optimal from a menu of many different ROs.
内容記述
The 3rd International Test Conference in Asia (ITC-Asia 2019), September 3-5, 2019Tokyo Denki University, Tokyo, Japan
雑誌名
2019 IEEE International Test Conference in Asia (ITC-Asia)
発行年
2019-10-17
出版者
IEEE
ISBN
978-1-7281-4718-5
978-1-7281-4719-2
DOI
info:doi/10.1109/ITC-Asia.2019.00016
権利
Copyright (c) 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
A Selection Method of Ring Oscillators for An On-Chip Digital Temperature And Voltage Sensor
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