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Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing
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transinf.E94.D.1216.pdf (2.7 MB)
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Item type | 学術雑誌論文 = Journal Article(1) | |||||||||||||||||||||||
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公開日 | 2020-01-15 | |||||||||||||||||||||||
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資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||||||||||||
資源タイプ | journal article | |||||||||||||||||||||||
タイトル | ||||||||||||||||||||||||
言語 | en | |||||||||||||||||||||||
タイトル | Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing | |||||||||||||||||||||||
言語 | ||||||||||||||||||||||||
言語 | eng | |||||||||||||||||||||||
著者 |
宮瀬, 紘平
× 宮瀬, 紘平
WEKO
6567
× Noda, Kenji× Ito, Hideaki× Hatayama, Kazumi× Aikyo, Takashi× Yamato, Yuta× Furukawa, Hiroshi× 温, 暁青
WEKO
1143
× 梶原, 誠司
WEKO
1147
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抄録 | ||||||||||||||||||||||||
内容記述タイプ | Abstract | |||||||||||||||||||||||
内容記述 | Test data modification based on test relaxation and X-filling is the preferred approach for reducing excessive IR-drop in at-speed scan testing to avoid test-induced yield loss. However, none of the existing test relaxation methods can control the distribution of identified don't care bits (X-bits), thus adversely affecting the effectiveness of IR-drop reduction. In this paper, we propose a novel test relaxation method, called Distribution-Controlled X-Identification (DC-XID), which controls the distribution of X-bits identified in a set of fully-specified test vectors for the purpose of effectively reducing IR-drop. Experiments on large industrial circuits demonstrate the effectiveness and practicality of the proposed method in reducing IR-drop, without lowering fault coverage, increasing test data volume and circuit size. | |||||||||||||||||||||||
言語 | en | |||||||||||||||||||||||
書誌情報 |
en : IEICE Transactions on Information and Systems 巻 E94.D, 号 6, p. 1216-1226, 発行日 2011-06-01 |
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言語 | ja | |||||||||||||||||||||||
出版者 | 電子情報通信学会 | |||||||||||||||||||||||
DOI | ||||||||||||||||||||||||
関連タイプ | isIdenticalTo | |||||||||||||||||||||||
識別子タイプ | DOI | |||||||||||||||||||||||
関連識別子 | https://doi.org/10.1587/transinf.E94.D.1216 | |||||||||||||||||||||||
CRID | ||||||||||||||||||||||||
関連タイプ | isIdenticalTo | |||||||||||||||||||||||
識別子タイプ | URI | |||||||||||||||||||||||
関連識別子 | https://cir.nii.ac.jp/crid/1390282679354636928 | |||||||||||||||||||||||
日本十進分類法 | ||||||||||||||||||||||||
主題Scheme | NDC | |||||||||||||||||||||||
主題 | 549 | |||||||||||||||||||||||
NCID | ||||||||||||||||||||||||
収録物識別子タイプ | NCID | |||||||||||||||||||||||
収録物識別子 | AA10826272 | |||||||||||||||||||||||
ISSN | ||||||||||||||||||||||||
収録物識別子タイプ | EISSN | |||||||||||||||||||||||
収録物識別子 | 1745-1361 | |||||||||||||||||||||||
ISSN | ||||||||||||||||||||||||
収録物識別子タイプ | PISSN | |||||||||||||||||||||||
収録物識別子 | 0916-8532 | |||||||||||||||||||||||
著作権関連情報 | ||||||||||||||||||||||||
権利情報 | Copyright (c) 2011 The Institute of Electronics, Information and Communication Engineers | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | ATPG | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | X-bit | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | X-identification | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | X-filling | |||||||||||||||||||||||
出版タイプ | ||||||||||||||||||||||||
出版タイプ | VoR | |||||||||||||||||||||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||||||||||||||||||
査読の有無 | ||||||||||||||||||||||||
値 | yes | |||||||||||||||||||||||
研究者情報 | ||||||||||||||||||||||||
https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html | ||||||||||||||||||||||||
論文ID(連携) | ||||||||||||||||||||||||
10231864 | ||||||||||||||||||||||||
連携ID | ||||||||||||||||||||||||
8041 |