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A power cycling degradation inspector of power semiconductor devices
http://hdl.handle.net/10228/00007909
http://hdl.handle.net/10228/00007909def310e0-8c7b-4f88-8b67-a6e3eb39284e
名前 / ファイル | ライセンス | アクション |
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nperc109.pdf (827.2 kB)
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Item type | 学術雑誌論文 = Journal Article(1) | |||||||||||||||||
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公開日 | 2020-09-30 | |||||||||||||||||
資源タイプ | ||||||||||||||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||||||
資源タイプ | journal article | |||||||||||||||||
タイトル | ||||||||||||||||||
タイトル | A power cycling degradation inspector of power semiconductor devices | |||||||||||||||||
言語 | ||||||||||||||||||
言語 | eng | |||||||||||||||||
著者 |
渡邉, 晃彦
× 渡邉, 晃彦
WEKO
16333
× 大村, 一郎
WEKO
16176
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抄録 | ||||||||||||||||||
内容記述タイプ | Abstract | |||||||||||||||||
内容記述 | We have proposed a failure analysis based on a real-time monitoring of power devices under acceleration test. The real-time monitoring enables to visualize the mechanism that leads to a failure by obtaining the change of structure inside the device in time domain with high spatial resolution. In this paper, we presented a new analytical instrument based on the proposed failure analysis concept. The essential functions of this instrument are (1) power stress control, (2) non-destructive inspection and (3) water circulation. An original design power-stress control system and a customized scanning acoustic microscopy system enable us a non-destructive inspection inside the device under power cycling test. This instrument exhibits a great advantage especially to monitor failure mechanisms without having to open the module. | |||||||||||||||||
書誌情報 |
Microelectronics Reliability 巻 88-90, p. 458-461, 発行日 2018-09-30 |
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出版社 | ||||||||||||||||||
出版者 | Elsevier | |||||||||||||||||
DOI | ||||||||||||||||||
関連タイプ | isVersionOf | |||||||||||||||||
識別子タイプ | DOI | |||||||||||||||||
関連識別子 | https://doi.org/10.1016/j.microrel.2018.06.071 | |||||||||||||||||
日本十進分類法 | ||||||||||||||||||
主題Scheme | NDC | |||||||||||||||||
主題 | 549 | |||||||||||||||||
NCID | ||||||||||||||||||
収録物識別子タイプ | NCID | |||||||||||||||||
収録物識別子 | AA11538014 | |||||||||||||||||
ISSN | ||||||||||||||||||
収録物識別子タイプ | ISSN | |||||||||||||||||
収録物識別子 | 0026-2714 | |||||||||||||||||
著作権関連情報 | ||||||||||||||||||
権利情報 | Copyright (c) 2018 Elsevier Ltd. | |||||||||||||||||
出版タイプ | ||||||||||||||||||
出版タイプ | AM | |||||||||||||||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||||||||
査読の有無 | ||||||||||||||||||
値 | yes | |||||||||||||||||
連携ID | ||||||||||||||||||
7486 | ||||||||||||||||||
資料タイプ | ||||||||||||||||||
内容記述タイプ | Other | |||||||||||||||||
内容記述 | Journal Article | |||||||||||||||||
著者所属 | ||||||||||||||||||
Department of Electrical Engineering/Electronics, Kyushu Institute of Technology, 1-1 Sensui, Tobata-ku, Kitakyushu 804-8550, Japan | ||||||||||||||||||
著者所属 | ||||||||||||||||||
Department of Biological Functions Engineering, Kyushu Institute of Technology, 2-4 Hibikino, Wakamatsu-ku, Kitakyushu 808-0196, Japan |