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Calculation of single event burnout failure rate for high voltage devices under satellite orbit without fitting parameters
http://hdl.handle.net/10228/00008474
http://hdl.handle.net/10228/000084749c8922a7-18f4-43c3-8d52-9ac88094b004
名前 / ファイル | ライセンス | アクション |
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nperc132.pdf (2.0 MB)
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Item type | 学術雑誌論文 = Journal Article(1) | |||||||||||
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公開日 | 2021-09-24 | |||||||||||
資源タイプ | ||||||||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||
資源タイプ | journal article | |||||||||||
タイトル | ||||||||||||
タイトル | Calculation of single event burnout failure rate for high voltage devices under satellite orbit without fitting parameters | |||||||||||
言語 | ||||||||||||
言語 | eng | |||||||||||
著者 |
Sudo, M.
× Sudo, M.× Nagamatsu, T.× Tsukuda, M.× 大村, 一郎
WEKO
16176
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抄録 | ||||||||||||
内容記述タイプ | Abstract | |||||||||||
内容記述 | Increase of power bus voltages in spacecraft are expected with the power demand growth. Accordingly, high voltage semiconductor devices in the power supply system will be required to withstand high energy and high flux cosmic ray environment. In this paper, we propose a new formula to calculate failure rate for power semiconductor devices in space application. | |||||||||||
書誌情報 |
Microelectronics Reliability 巻 100-101, p. 113396-1-113396-8, 発行日 2019-09-23 |
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出版社 | ||||||||||||
出版者 | Elsevier | |||||||||||
DOI | ||||||||||||
関連タイプ | isVersionOf | |||||||||||
識別子タイプ | DOI | |||||||||||
関連識別子 | https://doi.org/10.1016/j.microrel.2019.07.001 | |||||||||||
日本十進分類法 | ||||||||||||
主題Scheme | NDC | |||||||||||
主題 | 538 | |||||||||||
ISSN | ||||||||||||
収録物識別子タイプ | ISSN | |||||||||||
収録物識別子 | 0026-2714 | |||||||||||
著作権関連情報 | ||||||||||||
権利情報 | Copyright (c) 2019 Elsevier Ltd. All rights reserved. | |||||||||||
出版タイプ | ||||||||||||
出版タイプ | AM | |||||||||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||
査読の有無 | ||||||||||||
値 | yes | |||||||||||
連携ID | ||||||||||||
8015 | ||||||||||||
資料タイプ | ||||||||||||
内容記述タイプ | Other | |||||||||||
内容記述 | Journal Article | |||||||||||
著者所属 | ||||||||||||
Kyushu Institute of Technology, 1-1 Sensui-cho, Tobata-ku, Kitakyushu, Japan | ||||||||||||
著者所属 | ||||||||||||
Kyushu Institute of Technology, 2-4 Hibikino, Wakamatsu-ku, Kitakyushu-shi, Japan | ||||||||||||
著者所属 | ||||||||||||
Kyushu Institute of Technology, 2-4 Hibikino, Wakamatsu-ku, Kitakyushu-shi, Japan | ||||||||||||
著者所属 | ||||||||||||
Kyushu Institute of Technology, 2-4 Hibikino, Wakamatsu-ku, Kitakyushu-shi, Japan |