@inproceedings{weko_5043_1, author = "Sato, Yasuo and Kajihara, Seiji and Yoneda, Tomokazu and Hatayama, Kazumi and Inoue, Michiko and Miura, Yukiya and Ohtake, Satoshi and Hasegawa, Takumi and Sato, Motoyuki and Shimamura, Kotaro", title = "DART: Dependable VLSI Test Architecture and Its Implementation", booktitle = "2012 IEEE International Test Conference ", year = "2013", volume = "", number = "", publisher = "IEEE", month = "jan" }