@inproceedings{weko_5043_1,
   author	 = "Sato, Yasuo and Kajihara, Seiji and Yoneda, Tomokazu and Hatayama, Kazumi and Inoue, Michiko and Miura, Yukiya and Ohtake, Satoshi and Hasegawa, Takumi and Sato, Motoyuki and Shimamura, Kotaro",
   title	 = "DART: Dependable VLSI Test Architecture and Its Implementation",
   booktitle	 = "2012 IEEE International Test Conference ",
   year 	 = "2013",
   volume	 = "",
   number	 = "",
   publisher	 = "IEEE",
   month	 = "jan"
}