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X‐ray photoelectron spectroscopy of Nd2−xCexCuO4−y (x=0 and 0.15) thin films
http://hdl.handle.net/10228/1504
http://hdl.handle.net/10228/15042d037314-968e-431b-9c58-db2bb35cdc80
名前 / ファイル | ライセンス | アクション |
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kohiki_21.pdf (113.7 kB)
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Item type | 学術雑誌論文 = Journal Article(1) | |||||
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公開日 | 2009-02-20 | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | X‐ray photoelectron spectroscopy of Nd2−xCexCuO4−y (x=0 and 0.15) thin films | |||||
言語 | ||||||
言語 | eng | |||||
著者 |
古曵, 重美
× 古曵, 重美× Kawai, J× Hayashi, S× Adachi, H× Hatta, S× Setsune, K× Wasa, K |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Electronic structure of Nd2−xCexCuO4−y (x=0 and 0.15) thin films was examined by x-ray photoelectron spectroscopy. The films were prepared by rf magnetron sputtering and successive annealing under reducing condition (reduction). The reduced films showed semiconducting and superconducting behaviors depending on the value x. The Cu, O, and Nd core-level spectra revealed that the doped electrons were predominantly in CuO2 plane of the Nd2CuO4 crystal. The Cu core-level spectra from x=0.15 films before and after the reduction suggested that the reduction added electrons to Cu4s-O2p extended conduction band, and strengthened Cu O bond covalency to screen the core hole state by mobile itinerant electrons. Journal of Applied Physics is copyrighted by The American Institute of Physics. | |||||
言語 | en | |||||
書誌情報 |
en : Journal of Applied Physics 巻 68, 号 3, p. 1229-1232, 発行日 1990-08-01 |
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出版社 | ||||||
言語 | en | |||||
出版者 | American Institute of Physics | |||||
DOI | ||||||
関連タイプ | isIdenticalTo | |||||
識別子タイプ | DOI | |||||
関連識別子 | https://doi.org/10.1063/1.346722 | |||||
CRID | ||||||
関連タイプ | isIdenticalTo | |||||
識別子タイプ | URI | |||||
関連識別子 | https://cir.nii.ac.jp/crid/1571698602559228288 | |||||
NCID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA00693547 | |||||
ISSN | ||||||
収録物識別子タイプ | EISSN | |||||
収録物識別子 | 1089-7550 | |||||
ISSN | ||||||
収録物識別子タイプ | PISSN | |||||
収録物識別子 | 0021-8979 | |||||
著作権関連情報 | ||||||
権利情報 | Copyright © 1990 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | neodymium oxides | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | cerium oxides | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | copper oxides | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | films | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | electronic structure | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | photoelectron spectroscopy | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | x radiation | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | sputtering | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | annealing | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | reduction | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | semiconductor materials | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | high&minus | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | tc superconductors | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | transition temperature | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | core levels | |||||
出版タイプ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
査読の有無 | ||||||
値 | yes | |||||
業績ID | ||||||
10EBDBAFACDE53304925756100201FA0 |