WEKO3
アイテム
{"_buckets": {"deposit": "c3ddffa0-a74f-4f97-81df-1bf99a5e9e86"}, "_deposit": {"created_by": 3, "id": "1651", "owners": [3], "pid": {"revision_id": 0, "type": "depid", "value": "1651"}, "status": "published"}, "_oai": {"id": "oai:kyutech.repo.nii.ac.jp:00001651", "sets": ["9"]}, "author_link": ["6681", "6683", "6680", "6679", "6685", "6678", "572", "6686", "6677", "6682"], "item_21_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2008", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "1", "bibliographicPageStart": "012005", "bibliographicVolumeNumber": "97", "bibliographic_titles": [{"bibliographic_title": "Journal of Physics: Conference Series"}]}]}, "item_21_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "A precise and generalisable non-destructive measurement technique is required for evaluation of critical current density JC and electric field E vs. current density J properties in large-area and long-length high-temperature superconducting films. We measured E-J properties of a 2-inch phi Y-123 standard film for the calibration of our inductive measurement system using the third-harmonic voltage method. With adoption of a wideband-RL-cancel circuit, frequency normalised third-harmonic resistance contained noise less than 0.2 μΩs and power-law E-J dependencies were in the relatively wide electric field range of 1.4×10-6-1.6×10-4 V/m. Critical current density JC at 10-4 V/m on 7 different positions changed from an average of 2.839×1010A/m2 by a maximum of ±0.52%. As the JC distribution was also included, the maximum error margin of JC became remarkably small in the V3 inductive method. E-J properties of a 20×20mm square Dy-123 film agreed well with the properties measured by another research group. JC at 10-4 V/m and n value were 2.23×1010 A/m2 and 26.74 on the average of four different positions, with estimated systematic errors of -8.6% and +1.4%, respectively, by comparison of the averages of 16 positions measured by the same research group.", "subitem_description_type": "Abstract"}]}, "item_21_description_60": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"subitem_description": "Journal Article", "subitem_description_type": "Other"}]}, "item_21_full_name_3": {"attribute_name": "著者別名", "attribute_value_mlt": [{"affiliations": [{"affiliationNames": [{"affiliationName": "", "lang": "ja"}], "nameIdentifiers": []}], "familyNames": [{"familyName": "小田部", "familyNameLang": "ja"}, {"familyName": "オタベ", "familyNameLang": "ja-Kana"}, {"familyName": "Otabe", "familyNameLang": "en"}], "givenNames": [{"givenName": "エドモンド 荘司", "givenNameLang": "ja"}, {"givenName": "エドモンド ソウジ", "givenNameLang": "ja-Kana"}, {"givenName": "Edmund Soji", "givenNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "572", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "30231236", "nameIdentifierScheme": "e-Rad", "nameIdentifierURI": "https://nrid.nii.ac.jp/ja/nrid/1000030231236"}, {"nameIdentifier": "7003400054", "nameIdentifierScheme": "Scopus著者ID", "nameIdentifierURI": "https://www.scopus.com/authid/detail.uri?authorId=7003400054"}, {"nameIdentifier": "0000-0001-9880-8240", "nameIdentifierScheme": "ORCiD", "nameIdentifierURI": "https://orcid.org/0000-0001-9880-8240"}, {"nameIdentifier": "205", "nameIdentifierScheme": "九工大研究者情報", "nameIdentifierURI": "https://hyokadb02.jimu.kyutech.ac.jp/html/205_ja.html"}], "names": [{"name": "小田部, エドモンド 荘司", "nameLang": "ja"}, {"name": "オタベ, エドモンド ソウジ", "nameLang": "ja-Kana"}, {"name": "Otabe, Edmund Soji", "nameLang": "en"}]}]}, "item_21_publisher_7": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "IOP Publishing"}]}, "item_21_relation_12": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "10.1088/1742-6596/97/1/012005", "subitem_relation_type_select": "DOI"}}]}, "item_21_relation_14": {"attribute_name": "情報源", "attribute_value_mlt": [{"subitem_relation_name": [{"subitem_relation_name_text": "http://www.iop.org/EJ/abstract/1742-6596/97/1/012005/"}], "subitem_relation_type_id": {"subitem_relation_type_id_text": "http://www.iop.org/EJ/abstract/1742-6596/97/1/012005/", "subitem_relation_type_select": "URI"}}]}, "item_21_rights_13": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "© 2006 IOP Publishing Ltd"}]}, "item_21_select_59": {"attribute_name": "査読の有無", "attribute_value_mlt": [{"subitem_select_item": "yes"}]}, "item_21_source_id_8": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "1742-6596", "subitem_source_identifier_type": "ISSN"}]}, "item_21_text_36": {"attribute_name": "著者所属", "attribute_value_mlt": [{"subitem_text_value": "Maizuru National College of Technology, Electrical and Computer Engineering"}, {"subitem_text_value": "Maizuru National College of Technology, Electrical and Computer Engineering"}, {"subitem_text_value": "Maizuru National College of Technology, Electrical and Computer Engineering"}, {"subitem_text_value": "Maizuru National College of Technology, Electrical and Computer Engineering"}, {"subitem_text_value": "Maizuru National College of Technology, Electrical and Computer Engineering"}, {"subitem_text_value": "Maizuru National College of Technology, Electrical and Computer Engineering"}, {"subitem_text_value": "Maizuru National College of Technology, Electrical and Computer Engineering"}, {"subitem_text_value": "Kyushu Institute of Technology"}, {"subitem_text_value": "National Institute of Advanced Industrial Science and Technology"}, {"subitem_text_value": "National Institute of Advanced Industrial Science and Technology"}]}, "item_21_text_64": {"attribute_name": "業績ID", "attribute_value_mlt": [{"subitem_text_value": "104D2033241B2DE74925763B00263646"}]}, "item_21_version_type_58": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_ab4af688f83e57aa", "subitem_version_type": "AM"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Yamada, H"}], "nameIdentifiers": [{"nameIdentifier": "6677", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Minakuchi, T"}], "nameIdentifiers": [{"nameIdentifier": "6678", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Furuta, T"}], "nameIdentifiers": [{"nameIdentifier": "6679", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Takegami, K"}], "nameIdentifiers": [{"nameIdentifier": "6680", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Nakagawa, S"}], "nameIdentifiers": [{"nameIdentifier": "6681", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Kanayama, K"}], "nameIdentifiers": [{"nameIdentifier": "6682", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Hirachi, K"}], "nameIdentifiers": [{"nameIdentifier": "6683", "nameIdentifierScheme": "WEKO"}]}, {"creatorAffiliations": [{"affiliationNameIdentifiers": [], "affiliationNames": [{"affiliationName": "", "affiliationNameLang": "ja"}]}], "creatorNames": [{"creatorName": "小田部, エドモンド 荘司", "creatorNameLang": "ja"}, {"creatorName": "オタベ, エドモンド ソウジ", "creatorNameLang": "ja-Kana"}, {"creatorName": "Otabe, Edmund Soji", "creatorNameLang": "en"}], "familyNames": [{"familyName": "小田部", "familyNameLang": "ja"}, {"familyName": "オタベ", "familyNameLang": "ja-Kana"}, {"familyName": "Otabe", "familyNameLang": "en"}], "givenNames": [{"givenName": "エドモンド 荘司", "givenNameLang": "ja"}, {"givenName": "エドモンド ソウジ", "givenNameLang": "ja-Kana"}, {"givenName": "Edmund Soji", "givenNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "572", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "30231236", "nameIdentifierScheme": "e-Rad", "nameIdentifierURI": "https://nrid.nii.ac.jp/ja/nrid/1000030231236"}, {"nameIdentifier": "7003400054", "nameIdentifierScheme": "Scopus著者ID", "nameIdentifierURI": "https://www.scopus.com/authid/detail.uri?authorId=7003400054"}, {"nameIdentifier": "0000-0001-9880-8240", "nameIdentifierScheme": "ORCiD", "nameIdentifierURI": "https://orcid.org/0000-0001-9880-8240"}, {"nameIdentifier": "205", "nameIdentifierScheme": "九工大研究者情報", "nameIdentifierURI": "https://hyokadb02.jimu.kyutech.ac.jp/html/205_ja.html"}]}, {"creatorNames": [{"creatorName": "Mawatari, Y"}], "nameIdentifiers": [{"nameIdentifier": "6685", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Yamasaki, H"}], "nameIdentifiers": [{"nameIdentifier": "6686", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2009-09-24"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "Wideband.pdf", "filesize": [{"value": "434.5 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 434500.0, "url": {"label": "Wideband.pdf", "url": "https://kyutech.repo.nii.ac.jp/record/1651/files/Wideband.pdf"}, "version_id": "36af3325-cb5a-4537-b4a1-eb5b7994045a"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Wideband-RL-cancel circuit for the E-J property measurement using the third-harmonic voltage method", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Wideband-RL-cancel circuit for the E-J property measurement using the third-harmonic voltage method"}]}, "item_type_id": "21", "owner": "3", "path": ["9"], "permalink_uri": "http://hdl.handle.net/10228/2495", "pubdate": {"attribute_name": "公開日", "attribute_value": "2009-09-24"}, "publish_date": "2009-09-24", "publish_status": "0", "recid": "1651", "relation": {}, "relation_version_is_last": true, "title": ["Wideband-RL-cancel circuit for the E-J property measurement using the third-harmonic voltage method"], "weko_shared_id": -1}
Wideband-RL-cancel circuit for the E-J property measurement using the third-harmonic voltage method
http://hdl.handle.net/10228/2495
http://hdl.handle.net/10228/2495449dab0f-0a82-478d-8bcb-7f2e0d0c084b
名前 / ファイル | ライセンス | アクション |
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Wideband.pdf (434.5 kB)
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Item type | 学術雑誌論文 = Journal Article(1) | |||||||||||
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公開日 | 2009-09-24 | |||||||||||
資源タイプ | ||||||||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||
資源タイプ | journal article | |||||||||||
タイトル | ||||||||||||
タイトル | Wideband-RL-cancel circuit for the E-J property measurement using the third-harmonic voltage method | |||||||||||
言語 | ||||||||||||
言語 | eng | |||||||||||
著者 |
Yamada, H
× Yamada, H× Minakuchi, T× Furuta, T× Takegami, K× Nakagawa, S× Kanayama, K× Hirachi, K× 小田部, エドモンド 荘司
WEKO
572
× Mawatari, Y× Yamasaki, H |
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抄録 | ||||||||||||
内容記述タイプ | Abstract | |||||||||||
内容記述 | A precise and generalisable non-destructive measurement technique is required for evaluation of critical current density JC and electric field E vs. current density J properties in large-area and long-length high-temperature superconducting films. We measured E-J properties of a 2-inch phi Y-123 standard film for the calibration of our inductive measurement system using the third-harmonic voltage method. With adoption of a wideband-RL-cancel circuit, frequency normalised third-harmonic resistance contained noise less than 0.2 μΩs and power-law E-J dependencies were in the relatively wide electric field range of 1.4×10-6-1.6×10-4 V/m. Critical current density JC at 10-4 V/m on 7 different positions changed from an average of 2.839×1010A/m2 by a maximum of ±0.52%. As the JC distribution was also included, the maximum error margin of JC became remarkably small in the V3 inductive method. E-J properties of a 20×20mm square Dy-123 film agreed well with the properties measured by another research group. JC at 10-4 V/m and n value were 2.23×1010 A/m2 and 26.74 on the average of four different positions, with estimated systematic errors of -8.6% and +1.4%, respectively, by comparison of the averages of 16 positions measured by the same research group. | |||||||||||
書誌情報 |
Journal of Physics: Conference Series 巻 97, 号 1, p. 012005, 発行日 2008 |
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出版社 | ||||||||||||
出版者 | IOP Publishing | |||||||||||
DOI | ||||||||||||
関連タイプ | isVersionOf | |||||||||||
識別子タイプ | DOI | |||||||||||
関連識別子 | 10.1088/1742-6596/97/1/012005 | |||||||||||
ISSN | ||||||||||||
収録物識別子タイプ | ISSN | |||||||||||
収録物識別子 | 1742-6596 | |||||||||||
著作権関連情報 | ||||||||||||
権利情報 | © 2006 IOP Publishing Ltd | |||||||||||
出版タイプ | ||||||||||||
出版タイプ | AM | |||||||||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||
査読の有無 | ||||||||||||
値 | yes | |||||||||||
業績ID | ||||||||||||
104D2033241B2DE74925763B00263646 | ||||||||||||
著者別名 | ||||||||||||
姓名 | 小田部, エドモンド 荘司 | |||||||||||
言語 | ja | |||||||||||
姓名 | オタベ, エドモンド ソウジ | |||||||||||
言語 | ja-Kana | |||||||||||
姓名 | Otabe, Edmund Soji | |||||||||||
言語 | en | |||||||||||
情報源 | ||||||||||||
識別子タイプ | URI | |||||||||||
関連識別子 | http://www.iop.org/EJ/abstract/1742-6596/97/1/012005/ | |||||||||||
関連名称 | http://www.iop.org/EJ/abstract/1742-6596/97/1/012005/ |