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次世代LSIのための信号劣化回避型テスト方式に関する研究
http://hdl.handle.net/10228/4707
http://hdl.handle.net/10228/47072737280a-c64e-4aad-8d36-78435adeeea3
名前 / ファイル | ライセンス | アクション |
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19500047seika.pdf (234.1 kB)
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Item type | 研究報告書 = Research Paper(1) | |||||||||||
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公開日 | 2010-11-11 | |||||||||||
資源タイプ | ||||||||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_18ws | |||||||||||
資源タイプ | research report | |||||||||||
タイトル | ||||||||||||
タイトル | 次世代LSIのための信号劣化回避型テスト方式に関する研究 | |||||||||||
その他のタイトル | ||||||||||||
その他のタイトル | Research on Advanced VLSI Test for Avoiding Signal Degradation | |||||||||||
言語 | ||||||||||||
言語 | jpn | |||||||||||
著者 |
温, 暁青
× 温, 暁青
WEKO
1143
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備考 | ||||||||||||
内容記述タイプ | Other | |||||||||||
内容記述 | 研究期間:2007~2009, 研究種目:基盤研究(C), 科学研究費補助金研究成果報告書 | |||||||||||
書誌情報 | 発行日 2010-05-18 | |||||||||||
出版社 | ||||||||||||
出版者 | 九州工業大学 | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | LSIテスト | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | 高信頼化 | |||||||||||
出版タイプ | ||||||||||||
出版タイプ | VoR | |||||||||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||||||
査読の有無 | ||||||||||||
値 | no | |||||||||||
科研課題番号 | ||||||||||||
19500047 | ||||||||||||
著者所属 | ||||||||||||
九州工業大学情報工学研究院情報創成工学研究系 |