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Delay Testing: Improving Test Quality and Avoiding Over-testing
http://hdl.handle.net/10228/00006232
http://hdl.handle.net/10228/00006232ca9b21b5-711e-4f7f-84a7-2860248f59f2
名前 / ファイル | ライセンス | アクション |
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Ipsj4_117_130.pdf (422.7 kB)
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Item type | 学術雑誌論文 = Journal Article(1) | |||||||||||
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公開日 | 2017-06-06 | |||||||||||
資源タイプ | ||||||||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||
資源タイプ | journal article | |||||||||||
タイトル | ||||||||||||
タイトル | Delay Testing: Improving Test Quality and Avoiding Over-testing | |||||||||||
言語 | ||||||||||||
言語 | eng | |||||||||||
著者 |
梶原, 誠司
× 梶原, 誠司
WEKO
1147
× Ohtake, Satoshi× Yoneda, Tomokazu |
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抄録 | ||||||||||||
内容記述タイプ | Abstract | |||||||||||
内容記述 | Delay testing is one of key processes in production test to ensure high quality and high reliability for logic circuits. Test escape missing defective chips can be reduced by introducing delay testing. On the other hand, we need to concern yield loss caused by delay testing, i.e., over-testing. Many methods and techniques have been developed to solve problems on delay testing. In this paper, we introduce fundamental techniques of delay testing and survey recent problems and solutions. Especially we focus on techniques to enhance test quality, to avoid over-testing, and to make test design efficient by treating circuits described at register transfer level. | |||||||||||
書誌情報 |
IPSJ Transactions on System LSI Design Methodology 巻 4, p. 117-130, 発行日 2011-08-10 |
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出版社 | ||||||||||||
出版者 | 一般社団法人情報処理学会 | |||||||||||
DOI | ||||||||||||
関連タイプ | isIdenticalTo | |||||||||||
識別子タイプ | DOI | |||||||||||
関連識別子 | info:doi/10.2197/ipsjtsldm.4.117 | |||||||||||
ISSN | ||||||||||||
収録物識別子タイプ | ISSN | |||||||||||
収録物識別子 | 1882-6687 | |||||||||||
著作権関連情報 | ||||||||||||
権利情報 | Copyright (c) 2011 by the Information Processing Society of Japan | |||||||||||
著作権関連情報 | ||||||||||||
権利情報 | ここに掲載した著作物の利用に関する注意 本著作物の著作権は情報処理学会に帰属します。本著作物は著作権者である情報処理学会の許可のもとに掲載するものです。ご利用に当たっては「著作権法」ならびに「情報処理学会倫理綱領」に従うことをお願いいたします。 Notice for the use of this material The copyright of this material is retained by the Information Processing Society of Japan (IPSJ). This material is published on this web site with the agreement of the author (s) and the IPSJ. Please be complied with Copyright Law of Japan and the Code of Ethics of the IPSJ if any users wish to reproduce, make derivative work, distribute or make available to the public any part or whole thereof. All Rights Reserved, Copyright (C) Information Processing Society of Japan. | |||||||||||
出版タイプ | ||||||||||||
出版タイプ | VoR | |||||||||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||||||
査読の有無 | ||||||||||||
値 | yes | |||||||||||
研究者情報 | ||||||||||||
https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html | ||||||||||||
論文ID(連携) | ||||||||||||
10227023 | ||||||||||||
連携ID | ||||||||||||
4321 | ||||||||||||
情報源 | ||||||||||||
識別子タイプ | DOI | |||||||||||
関連識別子 | https://doi.org/10.2197/ipsjtsldm.4.117 | |||||||||||
関連名称 | https://doi.org/10.2197/ipsjtsldm.4.117 |