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アイテム
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ダブルパルス試験によるパワーエレクトロニクス機器用ノイズ計測システムの構築
http://hdl.handle.net/10228/00006496
http://hdl.handle.net/10228/00006496853ae92a-5918-4f8a-9508-78d70bb6e98b
名前 / ファイル | ライセンス | アクション |
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nperc98.pdf (751.9 kB)
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Item type | 会議発表用資料 = Presentation(1) | |||||||||||||||||
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公開日 | 2018-01-10 | |||||||||||||||||
資源タイプ | ||||||||||||||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_c94f | |||||||||||||||||
資源タイプ | conference object | |||||||||||||||||
タイトル | ||||||||||||||||||
タイトル | ダブルパルス試験によるパワーエレクトロニクス機器用ノイズ計測システムの構築 | |||||||||||||||||
その他のタイトル | ||||||||||||||||||
その他のタイトル | Front-Loading of EMI Test: A New Noise Measurement System | |||||||||||||||||
言語 | ||||||||||||||||||
言語 | jpn | |||||||||||||||||
著者 |
岩﨑, 量旺
× 岩﨑, 量旺× 長谷川, 一徳
WEKO
28366
× 安部, 征哉× 大村, 一郎
WEKO
16176
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抄録 | ||||||||||||||||||
内容記述タイプ | Abstract | |||||||||||||||||
内容記述 | The accurate measurement of EMI is essential because radiated noise from power electronics cause the malfunction of a peripheral device or itself. This paper develops a new EMI measurement system for power electronics equipment with double pulse test. The system is capable of confirming EMI level of power electronics equipment in an early stage of development. In addition, the system identifies the noise sources in the surface of the power electronics by scanning the near magnetic field. The system contributes to reducing the development period and cost of the power electronics equipment. | |||||||||||||||||
備考 | ||||||||||||||||||
内容記述タイプ | Other | |||||||||||||||||
内容記述 | 電気学会電子デバイス/半導体電力変換合同研究会(IEE-SPC)パワーデバイス・パワーエレクトロニクスとその実装技術, 2017年11月20日-21日, 鹿児島大学 稲盛会館, 鹿児島県 | |||||||||||||||||
書誌情報 |
電気学会研究会資料. EDD, 電子デバイス研究会 巻 2017, p. 59-62, 発行日 2017-11-20 |
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出版社 | ||||||||||||||||||
出版者 | 一般社団法人電気学会 | |||||||||||||||||
著作権関連情報 | ||||||||||||||||||
権利情報 | 一般社団法人電気学会 | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | パワーエレクトロニクス | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | 電磁妨害 | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | 半導体デバイスノイズ | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | スペクトル解析 | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | ダブルパルス試験 | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | ノイズ計測システム | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Power electronics | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Electromagnetic interference | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Semiconductor device noise | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Spectrum analysis, Double pulse test | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Noise measurement system | |||||||||||||||||
出版タイプ | ||||||||||||||||||
出版タイプ | VoR | |||||||||||||||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||||||||||||
査読の有無 | ||||||||||||||||||
値 | yes | |||||||||||||||||
連携ID | ||||||||||||||||||
6601 |