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On Detection of Bridge Defects with Stuck-at Tests
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ietisy_e91-d.3.683.pdf (2.1 MB)
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Item type | 学術雑誌論文 = Journal Article(1) | |||||||||||||||||||||||
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公開日 | 2020-01-15 | |||||||||||||||||||||||
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資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||||||||||||
資源タイプ | journal article | |||||||||||||||||||||||
タイトル | ||||||||||||||||||||||||
タイトル | On Detection of Bridge Defects with Stuck-at Tests | |||||||||||||||||||||||
言語 | ||||||||||||||||||||||||
言語 | eng | |||||||||||||||||||||||
著者 |
宮瀬, 紘平
× 宮瀬, 紘平
WEKO
6567
× Terashima, Kenta× 温, 暁青
WEKO
1143
× 梶原, 誠司
WEKO
1147
× Reddy, Sudhakar M. |
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抄録 | ||||||||||||||||||||||||
内容記述タイプ | Abstract | |||||||||||||||||||||||
内容記述 | If a test set for more complex faults than stuck-at faults is generated, higher defect coverage would be obtained. Such a test set, however, would have a large number of test vectors, and hence the test costs would go up. In this paper we propose a method to detect bridge defects with a test set initially generated for stuck-at faults in a full scan sequential circuit. The proposed method doesn't add new test vectors to the test set but modifies test vectors. Therefore there are no negative impacts on test data volume and test application time. The initial fault coverage for stuck-at faults of the test set is guaranteed with modified test vectors. In this paper we focus on detecting as many as possible non-feedback AND-type, OR-type and 4-way bridging faults, respectively. Experimental results show that the proposed method increases the defect coverage. | |||||||||||||||||||||||
書誌情報 |
IEICE Transactions on Information and Systems 巻 E91.D, 号 3, p. 683-689, 発行日 2008-03-01 |
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出版社 | ||||||||||||||||||||||||
出版者 | 電子情報通信学会 | |||||||||||||||||||||||
DOI | ||||||||||||||||||||||||
関連タイプ | isIdenticalTo | |||||||||||||||||||||||
識別子タイプ | DOI | |||||||||||||||||||||||
関連識別子 | info:doi/10.1093/ietisy/e91-d.3.683 | |||||||||||||||||||||||
論文ID(NAID) | ||||||||||||||||||||||||
関連タイプ | isIdenticalTo | |||||||||||||||||||||||
識別子タイプ | NAID | |||||||||||||||||||||||
関連識別子 | http://ci.nii.ac.jp/naid/10026802010 | |||||||||||||||||||||||
日本十進分類法 | ||||||||||||||||||||||||
主題Scheme | NDC | |||||||||||||||||||||||
主題 | 549 | |||||||||||||||||||||||
NCID | ||||||||||||||||||||||||
収録物識別子タイプ | NCID | |||||||||||||||||||||||
収録物識別子 | AA10826272 | |||||||||||||||||||||||
ISSN | ||||||||||||||||||||||||
収録物識別子タイプ | ISSN | |||||||||||||||||||||||
収録物識別子 | 1745-1361 | |||||||||||||||||||||||
ISSN | ||||||||||||||||||||||||
収録物識別子タイプ | ISSN | |||||||||||||||||||||||
収録物識別子 | 0916-8532 | |||||||||||||||||||||||
著作権関連情報 | ||||||||||||||||||||||||
権利情報 | Copyright (c) 2008 The Institute of Electronics, Information and Communication Engineers | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | defect based testing | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | test vector generation | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | test vector modification | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | bridging faults | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | fault extraction | |||||||||||||||||||||||
出版タイプ | ||||||||||||||||||||||||
出版タイプ | VoR | |||||||||||||||||||||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||||||||||||||||||
査読の有無 | ||||||||||||||||||||||||
値 | yes | |||||||||||||||||||||||
研究者情報 | ||||||||||||||||||||||||
https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html | ||||||||||||||||||||||||
論文ID(連携) | ||||||||||||||||||||||||
10029821 | ||||||||||||||||||||||||
連携ID | ||||||||||||||||||||||||
8038 | ||||||||||||||||||||||||
資料タイプ | ||||||||||||||||||||||||
内容記述タイプ | Other | |||||||||||||||||||||||
内容記述 | Journal Article | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Miyase, Kohei | |||||||||||||||||||||||
言語 | en | |||||||||||||||||||||||
姓名 | 宮瀬, 紘平 | |||||||||||||||||||||||
言語 | ja | |||||||||||||||||||||||
姓名 | ミヤセ, コウヘイ | |||||||||||||||||||||||
言語 | ja-Kana | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Terashima, K. | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Wen, Xiaoqing | |||||||||||||||||||||||
言語 | en | |||||||||||||||||||||||
姓名 | 温, 暁青 | |||||||||||||||||||||||
言語 | ja | |||||||||||||||||||||||
姓名 | オン, ギョウセイ | |||||||||||||||||||||||
言語 | ja-Kana | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Kajiihara, S. | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Reddy, S. M. | |||||||||||||||||||||||
著者所属 | ||||||||||||||||||||||||
Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology, Iizuka-shi, 820-8502, Japan | ||||||||||||||||||||||||
著者所属 | ||||||||||||||||||||||||
Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology, Iizuka-shi, 820-8502, Japan | ||||||||||||||||||||||||
著者所属 | ||||||||||||||||||||||||
Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology, Iizuka-shi, 820-8502, Japan | ||||||||||||||||||||||||
著者所属 | ||||||||||||||||||||||||
Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology, Iizuka-shi, 820-8502, Japan | ||||||||||||||||||||||||
著者所属 | ||||||||||||||||||||||||
Department of Electrical and Computer Engineering, University of Iowa, USA | ||||||||||||||||||||||||
情報源 | ||||||||||||||||||||||||
識別子タイプ | DOI | |||||||||||||||||||||||
関連識別子 | https://doi.org/10.1093/ietisy/e91-d.3.683 | |||||||||||||||||||||||
関連名称 | https://doi.org/10.1093/ietisy/e91-d.3.683 |