WEKO3
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High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme
名前 / ファイル | ライセンス | アクション |
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transinf.E93.D.2.pdf (1.8 MB)
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Item type | 学術雑誌論文 = Journal Article(1) | |||||||||||||||||||||||
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公開日 | 2020-01-15 | |||||||||||||||||||||||
資源タイプ | ||||||||||||||||||||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||||||||||||
資源タイプ | journal article | |||||||||||||||||||||||
タイトル | ||||||||||||||||||||||||
言語 | en | |||||||||||||||||||||||
タイトル | High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme | |||||||||||||||||||||||
言語 | ||||||||||||||||||||||||
言語 | eng | |||||||||||||||||||||||
著者 |
宮瀬, 紘平
× 宮瀬, 紘平
WEKO
6567
× 温, 暁青
WEKO
1143
× Furukawa, Hiroshi× Yamato, Yuta× 梶原, 誠司
WEKO
1147
× Girard, Patrick× Wang, Laung-Terng× Tehranipoor, Mohammad |
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抄録 | ||||||||||||||||||||||||
内容記述タイプ | Abstract | |||||||||||||||||||||||
内容記述 | At-speed scan testing is susceptible to yield loss risk due to power supply noise caused by excessive launch switching activity. This paper proposes a novel two-stage scheme, namely CTX (Clock-Gating-Based Test Relaxation and X-Filling), for reducing switching activity when a test stimulus is launched. Test relaxation and X-filling are conducted (1) to make as many FFs as possible inactive by disabling corresponding clock control signals of clock-gating circuitry in Stage-1 (Clock-Disabling), and (2) to equalize the input and output values in Stage-2of as many remaining active FFs as possible (FF-Silencing). CTX effectively reduces launch switching activity and thus yield loss risk even when only a small number of don't care (X) bits are present (as in test compression) without any impact on test data volume, fault coverage, performance, or circuit design. | |||||||||||||||||||||||
言語 | en | |||||||||||||||||||||||
書誌情報 |
en : IEICE Transactions on Information and Systems 巻 E93.D, 号 1, p. 2-9, 発行日 2010-01-01 |
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出版社 | ||||||||||||||||||||||||
言語 | ja | |||||||||||||||||||||||
出版者 | 電子情報通信学会 | |||||||||||||||||||||||
DOI | ||||||||||||||||||||||||
関連タイプ | isIdenticalTo | |||||||||||||||||||||||
識別子タイプ | DOI | |||||||||||||||||||||||
関連識別子 | https://doi.org/10.1587/transinf.E93.D.2 | |||||||||||||||||||||||
CRID | ||||||||||||||||||||||||
関連タイプ | isIdenticalTo | |||||||||||||||||||||||
識別子タイプ | URI | |||||||||||||||||||||||
関連識別子 | https://cir.nii.ac.jp/crid/1390001204378865152 | |||||||||||||||||||||||
日本十進分類法 | ||||||||||||||||||||||||
主題Scheme | NDC | |||||||||||||||||||||||
主題 | 549 | |||||||||||||||||||||||
NCID | ||||||||||||||||||||||||
収録物識別子タイプ | NCID | |||||||||||||||||||||||
収録物識別子 | AA10826272 | |||||||||||||||||||||||
ISSN | ||||||||||||||||||||||||
収録物識別子タイプ | EISSN | |||||||||||||||||||||||
収録物識別子 | 1745-1361 | |||||||||||||||||||||||
ISSN | ||||||||||||||||||||||||
収録物識別子タイプ | PISSN | |||||||||||||||||||||||
収録物識別子 | 0916-8532 | |||||||||||||||||||||||
著作権関連情報 | ||||||||||||||||||||||||
権利情報 | Copyright (c) 2010 The Institute of Electronics, Information and Communication Engineers | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | power supply noise | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | test relaxation | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | X-filling | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | clock-gating | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | test compaction | |||||||||||||||||||||||
出版タイプ | ||||||||||||||||||||||||
出版タイプ | VoR | |||||||||||||||||||||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||||||||||||||||||
査読の有無 | ||||||||||||||||||||||||
値 | yes | |||||||||||||||||||||||
研究者情報 | ||||||||||||||||||||||||
https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html | ||||||||||||||||||||||||
論文ID(連携) | ||||||||||||||||||||||||
10302941 | ||||||||||||||||||||||||
連携ID | ||||||||||||||||||||||||
8039 |