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A New Method for Low-Capture-Power Test Generation for Scan Testing
http://hdl.handle.net/10228/00007570
http://hdl.handle.net/10228/00007570b4a7b187-a3f1-4c13-a123-a4d11b64ae71
名前 / ファイル | ライセンス | アクション |
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10029813.pdf (836.0 kB)
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Item type | 学術雑誌論文 = Journal Article(1) | |||||||||||||||||
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公開日 | 2020-01-28 | |||||||||||||||||
資源タイプ | ||||||||||||||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||||||
資源タイプ | journal article | |||||||||||||||||
タイトル | ||||||||||||||||||
言語 | en | |||||||||||||||||
タイトル | A New Method for Low-Capture-Power Test Generation for Scan Testing | |||||||||||||||||
言語 | ||||||||||||||||||
言語 | eng | |||||||||||||||||
著者 |
温, 暁青
× 温, 暁青
WEKO
1143
× Yamashita, Yoshiyuki× 梶原, 誠司
WEKO
1147
× Wang, Laung-Terng× Saluja, Kewal K.× Kinoshita, Kozo |
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抄録 | ||||||||||||||||||
内容記述タイプ | Abstract | |||||||||||||||||
内容記述 | Research on low-power scan testing has been focused on the shift mode, with little consideration given to the capture mode power. However, high switching activity when capturing a test response can cause excessive IR-drop, resulting in significant yield loss due to faulty test results. This paper addresses this problem with a novel low-capture-power X-filling method by assigning 0's and 1's to unspecified bits (X-bits) in a test cube to reduce the switching activity in capture mode. This method can be easily incorporated into any test generation flow, where test cubes can be obtained during ATPG or by X-bit identification. Experimental results show the effectiveness of this method in reducing capture power dissipation without any impact on area, timing, and fault coverage. | |||||||||||||||||
言語 | en | |||||||||||||||||
書誌情報 |
en : IEICE Transactions on Information and Systems 巻 E89-D, 号 5, p. 1679-1686, 発行日 2006-05-01 |
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出版社 | ||||||||||||||||||
言語 | ja | |||||||||||||||||
出版者 | 電子情報通信学会 | |||||||||||||||||
DOI | ||||||||||||||||||
関連タイプ | isIdenticalTo | |||||||||||||||||
識別子タイプ | DOI | |||||||||||||||||
関連識別子 | https://doi.org/10.1093/ietisy/e89-d.5.1679 | |||||||||||||||||
CRID | ||||||||||||||||||
関連タイプ | isIdenticalTo | |||||||||||||||||
識別子タイプ | URI | |||||||||||||||||
関連識別子 | https://cir.nii.ac.jp/crid/1050283687642122880 | |||||||||||||||||
日本十進分類法 | ||||||||||||||||||
主題Scheme | NDC | |||||||||||||||||
主題 | 548 | |||||||||||||||||
NCID | ||||||||||||||||||
収録物識別子タイプ | NCID | |||||||||||||||||
収録物識別子 | AA10826272 | |||||||||||||||||
ISSN | ||||||||||||||||||
収録物識別子タイプ | EISSN | |||||||||||||||||
収録物識別子 | 1745-1361 | |||||||||||||||||
ISSN | ||||||||||||||||||
収録物識別子タイプ | PISSN | |||||||||||||||||
収録物識別子 | 0916-8532 | |||||||||||||||||
著作権関連情報 | ||||||||||||||||||
権利情報 | Copyright (c) 2006 The Institute of Electronics, Information and Communication Engineers | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | scan testing | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | capture power | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | X-bit | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | IR-drop | |||||||||||||||||
出版タイプ | ||||||||||||||||||
出版タイプ | VoR | |||||||||||||||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||||||||||||
査読の有無 | ||||||||||||||||||
値 | yes | |||||||||||||||||
研究者情報 | ||||||||||||||||||
https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html | ||||||||||||||||||
論文ID(連携) | ||||||||||||||||||
10029813 | ||||||||||||||||||
連携ID | ||||||||||||||||||
8076 |