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A novel scan segmentation design method for avoiding shift timing failure in scan testing
名前 / ファイル | ライセンス | アクション |
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10232922.pdf (927.8 kB)
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Item type | 学術雑誌論文 = Journal Article(1) | |||||||||||||||||||||||
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公開日 | 2020-02-04 | |||||||||||||||||||||||
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資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||||||||||||
資源タイプ | journal article | |||||||||||||||||||||||
タイトル | ||||||||||||||||||||||||
タイトル | A novel scan segmentation design method for avoiding shift timing failure in scan testing | |||||||||||||||||||||||
その他のタイトル | ||||||||||||||||||||||||
その他のタイトル | A Novel Scan Segmentation Design Method for Avoiding Shift Timing Failure in Scan Testing | |||||||||||||||||||||||
言語 | ||||||||||||||||||||||||
言語 | eng | |||||||||||||||||||||||
著者 |
Yamato, Yuta
× Yamato, Yuta× 温, 暁青
WEKO
1143
× Kochte, Michael A.× 宮瀬, 紘平
WEKO
6567
× 梶原, 誠司
WEKO
1147
× Wang, Laung-Terng |
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抄録 | ||||||||||||||||||||||||
内容記述タイプ | Abstract | |||||||||||||||||||||||
内容記述 | High power consumption in scan testing can cause undue yield loss which has increasingly become a serious problem for deep-submicron VLSI circuits. Growing evidence attributes this problem to shift timing failures, which are primarily caused by excessive switching activity in the proximities of clock paths that tends to introduce severe clock skew due to IR-drop-induced delay increase. This paper is the first of its kind to address this critical issue with a novel layout-aware scheme based on scan segmentation design, called LCTI-SS (Low-Clock-Tree-Impact Scan Segmentation). An optimal combination of scan segments is identified for simultaneous clocking so that the switching activity in the proximities of clock trees is reduced while maintaining the average power reduction effect on conventional scan segmentation. Experimental results on benchmark and industrial circuits have demonstrated the advantage of the LCTI-SS scheme. | |||||||||||||||||||||||
備考 | ||||||||||||||||||||||||
内容記述タイプ | Other | |||||||||||||||||||||||
内容記述 | 2011 IEEE International Test Conference, 20-22 September 2011, Anaheim, CA, USA | |||||||||||||||||||||||
書誌情報 |
2011 IEEE International Test Conference 発行日 2012-01-26 |
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出版者 | IEEE | |||||||||||||||||||||||
DOI | ||||||||||||||||||||||||
関連タイプ | isVersionOf | |||||||||||||||||||||||
識別子タイプ | DOI | |||||||||||||||||||||||
関連識別子 | info:doi/10.1109/TEST.2011.6139162 | |||||||||||||||||||||||
ISBN | ||||||||||||||||||||||||
識別子タイプ | ISBN | |||||||||||||||||||||||
関連識別子 | 978-1-4577-0153-5 | |||||||||||||||||||||||
ISBN | ||||||||||||||||||||||||
識別子タイプ | ISBN | |||||||||||||||||||||||
関連識別子 | 978-1-4577-0152-8 | |||||||||||||||||||||||
ISBN | ||||||||||||||||||||||||
識別子タイプ | ISBN | |||||||||||||||||||||||
関連識別子 | 978-1-4577-0151-1 | |||||||||||||||||||||||
日本十進分類法 | ||||||||||||||||||||||||
主題Scheme | NDC | |||||||||||||||||||||||
主題 | 548 | |||||||||||||||||||||||
ISSN | ||||||||||||||||||||||||
収録物識別子タイプ | ISSN | |||||||||||||||||||||||
収録物識別子 | 2378-2250 | |||||||||||||||||||||||
ISSN | ||||||||||||||||||||||||
収録物識別子タイプ | ISSN | |||||||||||||||||||||||
収録物識別子 | 1089-3539 | |||||||||||||||||||||||
ISSN | ||||||||||||||||||||||||
収録物識別子タイプ | ISSN | |||||||||||||||||||||||
収録物識別子 | 1089-3539 | |||||||||||||||||||||||
著作権関連情報 | ||||||||||||||||||||||||
権利情報 | Copyright (c) 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | scan testing | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | shift power reduction | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | scan segmentation | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | switching activity | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | clock tree | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | clock skew | |||||||||||||||||||||||
出版タイプ | ||||||||||||||||||||||||
出版タイプ | AM | |||||||||||||||||||||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||||||||||||||
査読の有無 | ||||||||||||||||||||||||
値 | yes | |||||||||||||||||||||||
研究者情報 | ||||||||||||||||||||||||
https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html | ||||||||||||||||||||||||
論文ID(連携) | ||||||||||||||||||||||||
10232922 | ||||||||||||||||||||||||
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8104 | ||||||||||||||||||||||||
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内容記述タイプ | Other | |||||||||||||||||||||||
内容記述 | Journal Article | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Yamato, Y. | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Wen, Xiaoqing | |||||||||||||||||||||||
言語 | en | |||||||||||||||||||||||
姓名 | 温, 暁青 | |||||||||||||||||||||||
言語 | ja | |||||||||||||||||||||||
姓名 | オン, ギョウセイ | |||||||||||||||||||||||
言語 | ja-Kana | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Kochte, M. A. | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Miyase, Kohei | |||||||||||||||||||||||
言語 | en | |||||||||||||||||||||||
姓名 | 宮瀬, 紘平 | |||||||||||||||||||||||
言語 | ja | |||||||||||||||||||||||
姓名 | ミヤセ, コウヘイ | |||||||||||||||||||||||
言語 | ja-Kana | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Kajihara, Seiji | |||||||||||||||||||||||
言語 | en | |||||||||||||||||||||||
姓名 | 梶原, 誠司 | |||||||||||||||||||||||
言語 | ja | |||||||||||||||||||||||
姓名 | カジハラ, セイジ | |||||||||||||||||||||||
言語 | ja-Kana | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Wang, L.-T. | |||||||||||||||||||||||
著者所属 | ||||||||||||||||||||||||
Fukuoka Industry Science Technology Foundation, Fukuoka, Japan | ||||||||||||||||||||||||
著者所属 | ||||||||||||||||||||||||
Kyushu Institute of Technology, Iizuka, Japan | ||||||||||||||||||||||||
著者所属 | ||||||||||||||||||||||||
Kyushu Institute of Technology, Iizuka, Japan | ||||||||||||||||||||||||
著者所属 | ||||||||||||||||||||||||
Kyushu Institute of Technology, Iizuka, Japan | ||||||||||||||||||||||||
著者所属 | ||||||||||||||||||||||||
Kyushu Institute of Technology, Iizuka, Japan | ||||||||||||||||||||||||
著者所属 | ||||||||||||||||||||||||
SynTest Technologies, Inc, Sunnyvale, CA, USA | ||||||||||||||||||||||||
情報源 | ||||||||||||||||||||||||
識別子タイプ | URI | |||||||||||||||||||||||
関連識別子 | DOI: 10.1109/TEST.2011.6139162 | |||||||||||||||||||||||
関連名称 | DOI: 10.1109/TEST.2011.6139162 |