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A Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation
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10056669.pdf (515.9 kB)
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Item type | 学術雑誌論文 = Journal Article(1) | |||||||||||||||||||||||
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公開日 | 2020-02-05 | |||||||||||||||||||||||
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資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||||||||||||
資源タイプ | journal article | |||||||||||||||||||||||
タイトル | ||||||||||||||||||||||||
タイトル | A Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation | |||||||||||||||||||||||
言語 | ||||||||||||||||||||||||
言語 | eng | |||||||||||||||||||||||
著者 |
温, 暁青
× 温, 暁青
WEKO
1143
× 宮瀬, 紘平
WEKO
6567
× Suzuki, Tatsuya× Yamato, Yuta× 梶原, 誠司
WEKO
1147
× Wang, Laung-Terng× Saluja, Kewal K. |
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抄録 | ||||||||||||||||||||||||
内容記述タイプ | Abstract | |||||||||||||||||||||||
内容記述 | X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced yield loss without the need of any circuit modification. However, the effectiveness of previous X-filling methods suffers from lack of guidance in selecting targets and values for X-filling. This paper addresses this problem with a highly-guided X-filling method based on two novel concepts: (1) X-score for X-filling target selection and (2) probabilistic weighted capture transition count for Y-filling value selection. Experimental results show the superiority of the new X-filling method for capture power reduction. | |||||||||||||||||||||||
備考 | ||||||||||||||||||||||||
内容記述タイプ | Other | |||||||||||||||||||||||
内容記述 | 2006 International Conference on Computer Design, 1-4 October 2006, San Jose, CA, USA | |||||||||||||||||||||||
書誌情報 |
2006 International Conference on Computer Design p. 251-258, 発行日 2007-11-12 |
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出版社 | ||||||||||||||||||||||||
出版者 | IEEE | |||||||||||||||||||||||
DOI | ||||||||||||||||||||||||
関連タイプ | isVersionOf | |||||||||||||||||||||||
識別子タイプ | DOI | |||||||||||||||||||||||
関連識別子 | info:doi/10.1109/ICCD.2006.4380825 | |||||||||||||||||||||||
ISBN | ||||||||||||||||||||||||
識別子タイプ | ISBN | |||||||||||||||||||||||
関連識別子 | 978-0-7803-9707-1 | |||||||||||||||||||||||
日本十進分類法 | ||||||||||||||||||||||||
主題Scheme | NDC | |||||||||||||||||||||||
主題 | 548 | |||||||||||||||||||||||
ISSN | ||||||||||||||||||||||||
収録物識別子タイプ | ISSN | |||||||||||||||||||||||
収録物識別子 | 1063-6404 | |||||||||||||||||||||||
著作権関連情報 | ||||||||||||||||||||||||
権利情報 | Copyright (c) 2006 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | Scan test | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | test generation | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | X-filling | |||||||||||||||||||||||
キーワード | ||||||||||||||||||||||||
主題Scheme | Other | |||||||||||||||||||||||
主題 | capture | |||||||||||||||||||||||
出版タイプ | ||||||||||||||||||||||||
出版タイプ | AM | |||||||||||||||||||||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||||||||||||||
査読の有無 | ||||||||||||||||||||||||
値 | yes | |||||||||||||||||||||||
研究者情報 | ||||||||||||||||||||||||
https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html | ||||||||||||||||||||||||
論文ID(連携) | ||||||||||||||||||||||||
10056669 | ||||||||||||||||||||||||
連携ID | ||||||||||||||||||||||||
8108 | ||||||||||||||||||||||||
資料タイプ | ||||||||||||||||||||||||
内容記述タイプ | Other | |||||||||||||||||||||||
内容記述 | Journal Article | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | X. Wen | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Miyase, Kohei | |||||||||||||||||||||||
言語 | en | |||||||||||||||||||||||
姓名 | 宮瀬, 紘平 | |||||||||||||||||||||||
言語 | ja | |||||||||||||||||||||||
姓名 | ミヤセ, コウヘイ | |||||||||||||||||||||||
言語 | ja-Kana | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Suzuki, T. | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Yamato, Y. | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Kajihara, Seiji | |||||||||||||||||||||||
言語 | en | |||||||||||||||||||||||
姓名 | 梶原, 誠司 | |||||||||||||||||||||||
言語 | ja | |||||||||||||||||||||||
姓名 | カジハラ, セイジ | |||||||||||||||||||||||
言語 | ja-Kana | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Wang, L.-T. | |||||||||||||||||||||||
著者別名 | ||||||||||||||||||||||||
姓名 | Saluja, K. K. | |||||||||||||||||||||||
著者所属 | ||||||||||||||||||||||||
Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan | ||||||||||||||||||||||||
著者所属 | ||||||||||||||||||||||||
Innovation Plaza Fukuoka, JST, Fukuoka 814-0001, Japan | ||||||||||||||||||||||||
著者所属 | ||||||||||||||||||||||||
Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan | ||||||||||||||||||||||||
著者所属 | ||||||||||||||||||||||||
Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan | ||||||||||||||||||||||||
著者所属 | ||||||||||||||||||||||||
Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan | ||||||||||||||||||||||||
著者所属 | ||||||||||||||||||||||||
SynTest Technologies, Inc., 505 S. Pastoria Ave., Suite 101, Sunnyvale, CA 94086, USA | ||||||||||||||||||||||||
著者所属 | ||||||||||||||||||||||||
Dept. of ECE, 1415 Engineering Drive, University of Wisconsin - Madison, Madison, WI 53706, USA | ||||||||||||||||||||||||
情報源 | ||||||||||||||||||||||||
識別子タイプ | URI | |||||||||||||||||||||||
関連識別子 | DOI: 10.1109/ICCD.2006.4380825 | |||||||||||||||||||||||
関連名称 | DOI: 10.1109/ICCD.2006.4380825 |