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Low-capture-power test generation for scan-based at-speed testing
http://hdl.handle.net/10228/00007599
http://hdl.handle.net/10228/00007599df3a1f04-7803-4c2a-9d82-bd01c06d507e
名前 / ファイル | ライセンス | アクション |
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10056662.pdf (147.6 kB)
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Item type | 学術雑誌論文 = Journal Article(1) | |||||||||||||||||
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公開日 | 2020-02-05 | |||||||||||||||||
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資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||||||
資源タイプ | journal article | |||||||||||||||||
タイトル | ||||||||||||||||||
タイトル | Low-capture-power test generation for scan-based at-speed testing | |||||||||||||||||
その他のタイトル | ||||||||||||||||||
その他のタイトル | Low-Capture-Power Test Generation for Scan-Based At-Speed Testing | |||||||||||||||||
言語 | ||||||||||||||||||
言語 | eng | |||||||||||||||||
著者 |
温, 暁青
× 温, 暁青
WEKO
1143
× Yamashita, Yoshiyuki× Morishima, Shohei× 梶原, 誠司
WEKO
1147
× Wang, Laung-Terng× Saluja, Kewal K.× Kinoshita, Kozo |
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抄録 | ||||||||||||||||||
内容記述タイプ | Abstract | |||||||||||||||||
内容記述 | Scan-based at-speed testing is a key technology to guarantee timing-related test quality in the deep submicron era. However, its applicability is being severely challenged since significant yield loss may occur from circuit malfunction due to excessive IR drop caused by high power dissipation when a test response is captured. This paper addresses this critical problem with a novel low-capture-power X-filling method of assigning 0's and 1's to unspecified (X) bits in a test cube obtained during ATPG. This method reduces the circuit switching activity in capture mode and can be easily incorporated into any test generation flow to achieve capture power reduction without any area, timing, or fault coverage impact. Test vectors generated with this practical method greatly improve the applicability of scan-based at-speed testing by reducing the risk of test yield loss | |||||||||||||||||
備考 | ||||||||||||||||||
内容記述タイプ | Other | |||||||||||||||||
内容記述 | IEEE International Conference on Test, 2005, 8 November 2005, Austin, TX, USA | |||||||||||||||||
書誌情報 |
IEEE International Conference on Test, 2005 発行日 2006-02-06 |
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出版者 | IEEE | |||||||||||||||||
DOI | ||||||||||||||||||
関連タイプ | isVersionOf | |||||||||||||||||
識別子タイプ | DOI | |||||||||||||||||
関連識別子 | info:doi/10.1109/TEST.2005.1584068 | |||||||||||||||||
ISBN | ||||||||||||||||||
識別子タイプ | ISBN | |||||||||||||||||
関連識別子 | 0-7803-9038-5 | |||||||||||||||||
日本十進分類法 | ||||||||||||||||||
主題Scheme | NDC | |||||||||||||||||
主題 | 548 | |||||||||||||||||
ISSN | ||||||||||||||||||
収録物識別子タイプ | ISSN | |||||||||||||||||
収録物識別子 | 1089-3539 | |||||||||||||||||
ISSN | ||||||||||||||||||
収録物識別子タイプ | ISSN | |||||||||||||||||
収録物識別子 | 2378-2250 | |||||||||||||||||
著作権関連情報 | ||||||||||||||||||
権利情報 | Copyright (c) 2005 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Circuit testing | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Logic testing | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Automatic testing | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Automatic test pattern generation | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Circuit faults | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Sequential analysis | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Delay | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Timing | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Logic circuits | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Costs | |||||||||||||||||
出版タイプ | ||||||||||||||||||
出版タイプ | AM | |||||||||||||||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||||||||
査読の有無 | ||||||||||||||||||
値 | yes | |||||||||||||||||
研究者情報 | ||||||||||||||||||
https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html | ||||||||||||||||||
論文ID(連携) | ||||||||||||||||||
10056662 | ||||||||||||||||||
連携ID | ||||||||||||||||||
8107 | ||||||||||||||||||
資料タイプ | ||||||||||||||||||
内容記述タイプ | Other | |||||||||||||||||
内容記述 | Journal Article | |||||||||||||||||
著者別名 | ||||||||||||||||||
姓名 | Wen, Xiaoqing | |||||||||||||||||
言語 | en | |||||||||||||||||
姓名 | 温, 暁青 | |||||||||||||||||
言語 | ja | |||||||||||||||||
姓名 | オン, ギョウセイ | |||||||||||||||||
言語 | ja-Kana | |||||||||||||||||
著者別名 | ||||||||||||||||||
姓名 | Yamashita, Y. | |||||||||||||||||
著者別名 | ||||||||||||||||||
姓名 | Morishima, S. | |||||||||||||||||
著者別名 | ||||||||||||||||||
姓名 | Kajiihara, S. | |||||||||||||||||
著者別名 | ||||||||||||||||||
姓名 | Wang, L.-T. | |||||||||||||||||
著者別名 | ||||||||||||||||||
姓名 | Saluja, K. K. | |||||||||||||||||
著者別名 | ||||||||||||||||||
姓名 | Kinoshita, K. | |||||||||||||||||
著者所属 | ||||||||||||||||||
Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan | ||||||||||||||||||
著者所属 | ||||||||||||||||||
Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan | ||||||||||||||||||
著者所属 | ||||||||||||||||||
Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan | ||||||||||||||||||
著者所属 | ||||||||||||||||||
Dept. of CSE, Kyushu Institute of Technology, Iizuka 820-8502, Japan | ||||||||||||||||||
著者所属 | ||||||||||||||||||
SynTest Technologies, Inc., 505 S. Pastoria Ave., Suite 101, Sunnyvale, CA 94086, USA | ||||||||||||||||||
著者所属 | ||||||||||||||||||
Dept. of ECE, 1415 Engineering Drive, University of Wisconsin - Madison, Madison, WI 53706, USA | ||||||||||||||||||
著者所属 | ||||||||||||||||||
Faculty of Informatics, Osaka Gakuin University, Suita 564-8511, Japan | ||||||||||||||||||
情報源 | ||||||||||||||||||
識別子タイプ | URI | |||||||||||||||||
関連識別子 | DOI: 10.1109/TEST.2005.1584068 | |||||||||||||||||
関連名称 | DOI: 10.1109/TEST.2005.1584068 |