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VLSI Testing and Test Power
http://hdl.handle.net/10228/00007607
http://hdl.handle.net/10228/000076077321839f-9dc9-429d-8dd9-05f1a8234453
名前 / ファイル | ライセンス | アクション |
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10232898.pdf (1.5 MB)
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Item type | 学術雑誌論文 = Journal Article(1) | |||||||||||
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公開日 | 2020-02-10 | |||||||||||
資源タイプ | ||||||||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||
資源タイプ | journal article | |||||||||||
タイトル | ||||||||||||
タイトル | VLSI Testing and Test Power | |||||||||||
言語 | ||||||||||||
言語 | eng | |||||||||||
著者 |
温, 暁青
× 温, 暁青
WEKO
1143
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抄録 | ||||||||||||
内容記述タイプ | Abstract | |||||||||||
内容記述 | This paper first reviews the basics of VLSI testing, focusing on test generation and design for testability. Then it discusses the impact of test power in scan testing, and highlights the need for low-power VLSI testing. | |||||||||||
備考 | ||||||||||||
内容記述タイプ | Other | |||||||||||
内容記述 | 2011 International Green Computing Conference and Workshops (IGCC 2011), July 25-28, 2011, Orlando, FL, USA | |||||||||||
書誌情報 |
2011 International Green Computing Conference and Workshops 発行日 2011-09-01 |
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出版社 | ||||||||||||
出版者 | IEEE | |||||||||||
DOI | ||||||||||||
関連タイプ | isVersionOf | |||||||||||
識別子タイプ | DOI | |||||||||||
関連識別子 | info:doi/10.1109/IGCC.2011.6008607 | |||||||||||
ISBN | ||||||||||||
識別子タイプ | ISBN | |||||||||||
関連識別子 | 978-1-4577-1221-0 | |||||||||||
ISBN | ||||||||||||
識別子タイプ | ISBN | |||||||||||
関連識別子 | 978-1-4577-1222-7 | |||||||||||
ISBN | ||||||||||||
識別子タイプ | ISBN | |||||||||||
関連識別子 | 978-1-4577-1220-3 | |||||||||||
日本十進分類法 | ||||||||||||
主題Scheme | NDC | |||||||||||
主題 | 548 | |||||||||||
著作権関連情報 | ||||||||||||
権利情報 | Copyright (c) 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | VLSI testing | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | test generation | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | design for testability | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | scan design | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | scan testing | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | at-speed scan testing | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | test power | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | shift power | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | capture power | |||||||||||
キーワード | ||||||||||||
主題Scheme | Other | |||||||||||
主題 | low-power testing | |||||||||||
出版タイプ | ||||||||||||
出版タイプ | AM | |||||||||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||
査読の有無 | ||||||||||||
値 | yes | |||||||||||
研究者情報 | ||||||||||||
https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html | ||||||||||||
論文ID(連携) | ||||||||||||
10232898 | ||||||||||||
連携ID | ||||||||||||
8116 | ||||||||||||
資料タイプ | ||||||||||||
内容記述タイプ | Other | |||||||||||
内容記述 | Journal Article | |||||||||||
著者別名 | ||||||||||||
姓名 | Wen, Xiaoqing | |||||||||||
言語 | en | |||||||||||
姓名 | 温, 暁青 | |||||||||||
言語 | ja | |||||||||||
姓名 | オン, ギョウセイ | |||||||||||
言語 | ja-Kana | |||||||||||
著者所属 | ||||||||||||
Department of Computer Systems and Engineering, Kyushu Institute of Technology, Iizuka, Japan | ||||||||||||
情報源 | ||||||||||||
識別子タイプ | URI | |||||||||||
関連識別子 | DOI: 10.1109/IGCC.2011.6008607 | |||||||||||
関連名称 | DOI: 10.1109/IGCC.2011.6008607 |