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DUT Temperature Coefficient and Power Cycles to Failure
http://hdl.handle.net/10228/00008399
http://hdl.handle.net/10228/00008399a3ac249b-0026-4c71-9cbc-65f78ae8f8a9
名前 / ファイル | ライセンス | アクション |
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nperc180.pdf (421.2 kB)
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Item type | 学術雑誌論文 = Journal Article(1) | |||||||||||||||||
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公開日 | 2021-07-02 | |||||||||||||||||
資源タイプ | ||||||||||||||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||||||
資源タイプ | journal article | |||||||||||||||||
タイトル | ||||||||||||||||||
タイトル | DUT Temperature Coefficient and Power Cycles to Failure | |||||||||||||||||
言語 | ||||||||||||||||||
言語 | eng | |||||||||||||||||
著者 |
Kawauchi, Yuma
× Kawauchi, Yuma× Akimoto, Kenji× 渡邉, 晃彦
WEKO
16333
× 大村, 一郎
WEKO
16176
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抄録 | ||||||||||||||||||
内容記述タイプ | Abstract | |||||||||||||||||
内容記述 | We demonstrated power cycling tests with different temperature coefficient samples and shown that cycles to failure strongly depends upon the coefficient. The test samples are investigated by SAT before and after the failure. As a result, we clarified the relationship between the DUT temperature coefficient and failure mechanism. The temperature coefficient is extremely important as a parameter for power cycle tests. High temperature coefficient can lead shorter cycles to failure by thermal runaway before bonding wire disconnection. We also proposed a new method to control temperature coefficient of DUT with gate voltage clamping to drain voltage. | |||||||||||||||||
備考 | ||||||||||||||||||
内容記述タイプ | Other | |||||||||||||||||
内容記述 | 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD 2021), 30th of May and 3rd of June, 2021, Full Virtual Conference | |||||||||||||||||
書誌情報 |
2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD) p. 171-174, 発行日 2021-06-15 |
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出版社 | ||||||||||||||||||
出版者 | IEEE | |||||||||||||||||
DOI | ||||||||||||||||||
関連タイプ | isVersionOf | |||||||||||||||||
識別子タイプ | DOI | |||||||||||||||||
関連識別子 | https://doi.org/10.23919/ISPSD50666.2021.9452298 | |||||||||||||||||
ISBN | ||||||||||||||||||
識別子タイプ | ISBN | |||||||||||||||||
関連識別子 | 978-4-88686-422-2 | |||||||||||||||||
ISBN | ||||||||||||||||||
識別子タイプ | ISBN | |||||||||||||||||
関連識別子 | 978-1-7281-8985-7 | |||||||||||||||||
日本十進分類法 | ||||||||||||||||||
主題Scheme | NDC | |||||||||||||||||
主題 | 549 | |||||||||||||||||
ISSN | ||||||||||||||||||
収録物識別子タイプ | ISSN | |||||||||||||||||
収録物識別子 | 1946-0201 | |||||||||||||||||
ISSN | ||||||||||||||||||
収録物識別子タイプ | ISSN | |||||||||||||||||
収録物識別子 | 1063-6854 | |||||||||||||||||
著作権関連情報 | ||||||||||||||||||
権利情報 | Copyright (c) 2021 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Power cycling test | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Temperature Coefficient | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | SAT | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Thermal Runaway | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Solder Crack | |||||||||||||||||
出版タイプ | ||||||||||||||||||
出版タイプ | AM | |||||||||||||||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||||||||
査読の有無 | ||||||||||||||||||
値 | yes | |||||||||||||||||
連携ID | ||||||||||||||||||
9003 | ||||||||||||||||||
資料タイプ | ||||||||||||||||||
内容記述タイプ | Other | |||||||||||||||||
内容記述 | Journal Article | |||||||||||||||||
著者所属 | ||||||||||||||||||
Kyushu Institute of Technology | ||||||||||||||||||
著者所属 | ||||||||||||||||||
Kyushu Institute of Technology | ||||||||||||||||||
著者所属 | ||||||||||||||||||
Kyushu Institute of Technology | ||||||||||||||||||
著者所属 | ||||||||||||||||||
Kyushu Institute of Technology |