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Failure Analysis of Power Devices Based on Real-Time Monitoring
http://hdl.handle.net/10228/00006262
http://hdl.handle.net/10228/000062621d8da338-41d2-42c5-a4c4-e8291ce4ca34
名前 / ファイル | ライセンス | アクション |
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nperc63.pdf (412.5 kB)
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Item type | 学術雑誌論文 = Journal Article(1) | |||||||||||||||||
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公開日 | 2017-07-18 | |||||||||||||||||
資源タイプ | ||||||||||||||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||||||
資源タイプ | journal article | |||||||||||||||||
タイトル | ||||||||||||||||||
タイトル | Failure Analysis of Power Devices Based on Real-Time Monitoring | |||||||||||||||||
言語 | ||||||||||||||||||
言語 | eng | |||||||||||||||||
著者 |
渡邉, 晃彦
× 渡邉, 晃彦
WEKO
16333
× Tsukuda, M.× 大村, 一郎
WEKO
16176
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抄録 | ||||||||||||||||||
内容記述タイプ | Abstract | |||||||||||||||||
内容記述 | The aim is to provide failure analysis of power devices based on real-time monitoring. The real-time monitoring provides a time-domain data related to a failure mechanism. The data includes important information about primary failure, which is often lost by conventional post-defect failure analysis. Our system monitors interfaces of component material inside the device by scanning acoustic tomography (SAT) under a power cycling test in addition to electrical and thermal condition of the device. A precursor of the failure in an early stage was indicated by the interface image much earlier than a thermal and an electrical technique. Feature identification and extraction from a series of image data by image processing efficiently pointed out the damaged site before the failure was occurred. | |||||||||||||||||
備考 | ||||||||||||||||||
内容記述タイプ | Other | |||||||||||||||||
内容記述 | ESREF 2015, 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 5-9, 2015, Centre de Congrès Pierre Baudis, Toulouse, France | |||||||||||||||||
書誌情報 |
Microelectronics Reliability 巻 55, 号 9-10, p. 2032-2035, 発行日 2015-07-17 |
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出版社 | ||||||||||||||||||
出版者 | Elsevier | |||||||||||||||||
DOI | ||||||||||||||||||
関連タイプ | isVersionOf | |||||||||||||||||
識別子タイプ | DOI | |||||||||||||||||
関連識別子 | https://doi.org/10.1016/j.microrel.2015.06.128 | |||||||||||||||||
NCID | ||||||||||||||||||
収録物識別子タイプ | NCID | |||||||||||||||||
収録物識別子 | AA11538014 | |||||||||||||||||
ISSN | ||||||||||||||||||
収録物識別子タイプ | ISSN | |||||||||||||||||
収録物識別子 | 0026-2714 | |||||||||||||||||
著作権関連情報 | ||||||||||||||||||
権利情報 | Copyright (c) 2015 Elsevier Ltd. | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Power devices | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Failure analysis | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Real-time monitoring | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
主題 | Image processing | |||||||||||||||||
キーワード | ||||||||||||||||||
主題Scheme | Other | |||||||||||||||||
出版タイプ | ||||||||||||||||||
出版タイプ | AM | |||||||||||||||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||||||||
査読の有無 | ||||||||||||||||||
値 | yes | |||||||||||||||||
連携ID | ||||||||||||||||||
5587 | ||||||||||||||||||
資料タイプ | ||||||||||||||||||
内容記述タイプ | Other | |||||||||||||||||
内容記述 | Journal Article | |||||||||||||||||
著者所属 | ||||||||||||||||||
Department of Electrical Engineering/Electronics, Kyushu Institute of Technology/Next generation power electronics research center, Kyushu Institute of Technology | ||||||||||||||||||
著者所属 | ||||||||||||||||||
Electronics Research Group for Sustainability, Asian Growth Research Institute/Next generation power electronics research center, Kyushu Institute of Technology | ||||||||||||||||||
著者所属 | ||||||||||||||||||
Department of Electrical Engineering/Electronics, Kyushu Institute of Technology/Next generation power electronics research center, Kyushu Institute of Technology |