【延期】~~2021年9月13日(月)～17日(金)　リポジトリ停止のお知らせ~~　詳しくはこちら

Kyutacar　九州工業大学学術機関リポジトリ

Kyushu Institute of Technology Academic Repository

Kyutacarは九州工業大学で生産された研究成果を
オープンアクセスで提供する機関リポジトリシステムです。
Kyutacar is open-access repository of research
by members of the Kyushu Institute of Technology.

日本語 | English

		Menu

トップページ研究成果の登録博士論文の登録本学出版物 News・メンテナンス情報 FAQ Kyutacarについて【延期】リポジトリ停止のお知らせｵｰﾌﾟﾝｱｸｾｽｳｨｰｸ2021

		New Items

最新

Perovskite Solar Cells in S...

Bandgap engineering of poly...

Towards a P4-based Dynamic ...

Multi-site information exch...

DNSクエリログを用いたアクセス先ドメインの類似性に基...

		Link

		Browse & Search


	トップ


	ランキング

詳細検索

全文検索キーワード検索

検索条件を追加検索条件を追加

NIIsubject	NDC	NDLC	BSH	NDLSH	MeSH
DDC	LCC	UDC	LCSH

テスト

学位論文 / Thesis or Dissertation

学術雑誌論文 / Journal Article

図書 / Book

その他 / Others

会議発表用資料 / Presentation

研究報告書 / Research Paper

テクニカルレポート / Technical Report

会議発表論文 / Conference Paper

紀要論文 / Departmental Bulletin Paper

紀要論文 / Departmental Bulletin Paper_02

学術雑誌論文 / Journal Article_02

図書 / Book_02

その他 / Others_02

会議発表用資料 / Presentation_02

研究報告書 / Research Paper_02

テクニカルレポート / Technical Report_02

会議発表論文 / Conference Paper_02

紀要論文 / Departmental Bulletin Paper_03

学位論文 = Thesis or Dissertation

学術雑誌論文 = Journal Article

研究報告書 = Research Paper

会議発表論文 = Conference Paper

テクニカルレポート = Technical Report

紀要論文 = Departmental Bulletin Paper

その他 = Others

会議発表用資料 = Presentation

図書 = Book

学術雑誌論文_JAIRO Cloud（WEKO3）対応_2653615e

会議発表論文 = Conference Paper_02

学術雑誌論文 / Journal Article_default

紀要論文 / Departmental Bulletin Paper_default

会議発表論文 / Conference Paper_default

一般雑誌記事 / Article

会議発表用資料 / Presentation_default

学位論文 / Thesis or Dissertation_default

報告書 / Research Paper

図書 / Book_default

図書の一部 / Book

その他 / Others_default

DublinCore

Journal Article

Thesis or Dissertation

Departmental Bulletin Paper

Conference Paper

Presentation

Book

Technical Report

Research Paper

Article

Preprint

Learning Material

Data or Dataset

Software

Others

Learning Object Metadata

LIDO

Journal Article	Thesis or Dissertation	Departmental Bulletin Paper
Conference Paper	Presentation	Book
Technical Report	Research Paper	Article
Preprint	Learning Material	Data or Dataset
Software	Others

identifier	URI	fullTextURL	selfDOI	ISBN	ISSN
NCID	pmid	doi	NAID	ichushi

日本語	英語	フランス語	イタリア語	ドイツ語
スペイン語	中国語	ロシア語	ラテン語	マレー語
エスペラント語	アラビア語	ギリシャ語	朝鮮語	その他の言語

CC BY	CC BY-SA	CC BY-ND	CC BY-NC
CC BY-NC-SA	CC BY-NC-ND	自由記述

author

publisher

ETD

none

sitemap

Language

インデックスツリー

検索結果

1 - 20 of 38 items

表示順表示数

A Flexible Scan-in Power Control Method in Logic BIST and Its Evaluation with TEG Chips

Kato Takaaki , Wang Senling , Sato Yasuo , Kajihara Seiji , Wen Xiaoqing
IEEE Transactions on Emerging Topics in Computing,8(3),591-601 (2020-09-01)

pdf

STAHL: A Novel Scan-Test-Aware Hardened Latch Design

Ma Ruijun , Holst Stefan , Wen Xiaoqing , Yan Aibin , Xu Hui
2019 IEEE European Test Symposium (ETS), (2019-08-08)

pdf

Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption

Zhang Yucong , Holst Stefan , Wen Xiaoqing , Miyase Kohei , Kajihara Seiji , Qianz Jun
2017 IEEE 26th Asian Test Symposium (ATS), (2018-01-25)

pdf

Vernier ring based pre-bond through silicon vias test in 3D ICs

Ni Tianming , Nie Mu , Liang Huaguo , Bian Jingchang , Xu Xiumin , Fang Xiangsheng , Huang Zhengfeng , Wen Xiaoqing
IEICE Electronics Express,14(18),20170590-1-20170590-11 (2017-09-25) , Vernier Ring Based Pre-bond Through Silicon Vias Test in 3D ICs

pdf

Power-Aware Testing For Low-Power VLSI Circuits

Wen Xiaoqing
2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT),585-588 (2017-08-03)

pdf

A Flexible Power Control Method for Right Power Testing of Scan-Based Logic BIST

Kato Takaaki , Wang Senling , Sato Yasuo , Kajihara Seiji , Wen Xiaoqing
Asian Test Symposium (ATS), 2016 IEEE 25th ,203-208 (2016-12-26)

pdf

Reseeding-Oriented Test Power Reduction for Linear-Decompression-Based Test Compression Architectures

Chen Tian , Shen Dandan , Yi Xin , Liang Huaguo , Wen Xiaoqing , Wang Wei
IEICE Transactions on Information and Systems ,E99.D(11),2672-2681 (2016-11-01)

pdf

On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST

Tomita Akihiro , Wen Xiaoqing , Sato Yasuo , Kajihara Seiji , Miyase Kohei , Holst Stefan , Girard Patrick , Tehranipoor Mohammad , Wang Laung-Terng
IEICE Transactions on Information and Systems ,E97.D(10),2706-2718 (2014-10-01)

pdf

A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing

Miyase Kohei , Sakai Ryota , Wen Xiaoqing , Aso Masao , Furukawa Hiroshi , Yamato Yuta , Kajihara Seiji
IEICE Transactions on Information and Systems ,E96.D(9),2003-2011 (2013-09-01)

pdf

On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression

Enokimoto Kazunari , Wen Xiaoqing , Miyase Kohei , Huang Jiun-Lang , Kajihara Seiji , Wang Laung-Terng
2013 26th International Conference on VLSI Design and 2013 12th International Conference on Embedded Systems,279-284 (2013-01-05)

pdf

Fault Detection with Optimum March Test Algorithm

Zakaria Nor Azura , Hassan W. Z. W. , Halin I. A. , Sidek R. M. , Wen Xiaoqing
Journal of Theoretical and Applied Information Technology,47(1),18-27 (2013-01-01)

pdf

Clock-gating-aware low launch WSA test pattern generation for at-speed scan testing

Lin Yi-Tsung , Huang Jiun-Lang , Wen Xiaoqing
2011 IEEE International Test Conference, (2012-01-26) , Clock-Gating-Aware Low Launch WSA Test Pattern Generation for At-Speed Testing

pdf

A novel scan segmentation design method for avoiding shift timing failure in scan testing

Yamato Yuta , Wen Xiaoqing , Kochte Michael A. , Miyase Kohei , Kajihara Seiji , Wang Laung-Terng
2011 IEEE International Test Conference, (2012-01-26) , A Novel Scan Segmentation Design Method for Avoiding Shift Timing Failure in Scan Testing

pdf

VLSI Testing and Test Power

Wen Xiaoqing
2011 International Green Computing Conference and Workshops, (2011-09-01)

pdf

Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing

Miyase Kohei , Noda Kenji , Ito Hideaki , Hatayama Kazumi , Aikyo Takashi , Yamato Yuta , Furukawa Hiroshi , Wen Xiaoqing , Kajihara Seiji
IEICE Transactions on Information and Systems ,E94.D(6),1216-1226 (2011-06-01)

pdf

A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing

Yamato Yuta , Wen Xiaoqing , Miyase Kohei , Furukawa Hiroshi , Kajihara Seiji
IEICE Transactions on Information and Systems ,E94.D(4),833-840 (2011-04-01)

pdf

On Delay Test Quality for Test Cubes

Oku Shinji , Kajihara Seiji , Sato Yasuo , Miyase Kohei , Wen Xiaoqing
IPSJ Transactions on System LSI Design Methodology,3,283-291 (2010-08-16)

pdf

High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme

Miyase Kohei , Wen Xiaoqing , Furukawa Hiroshi , Yamato Yuta , Kajihara Seiji , Girard Patrick , Wang Laung-Terng , Tehranipoor Mohammad
IEICE Transactions on Information and Systems ,E93.D(1),2-9 (2010-01-01)

pdf

A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing

Yamato Yuta , Wen Xiaoqing , Miyase Kohei , Furukawa Hiroshi , Kajihara Seiji
2009 15th IEEE Pacific Rim International Symposium on Dependable Computing,81-86 (2009-12-31)

pdf

Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment

Wu Meng-Fan , Huang Jiun-Lang , Wen Xiaoqing , Miyase K
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems,28(11),1767-1776 (2009-11)

pdf

"Kyutacar"に登録されているコンテンツの著作権は，執筆者，出版社（学協会）などが有します。
"Kyutacar"に登録されているコンテンツの利用については，著作権法に規定されている私的使用や引用などの範囲内で行ってください。
著作権に規定されている私的使用や引用などの範囲を超える利用を行う場合には，著作権者の許諾を得てください。

Kyutacar 九州工業大学学術機関リポジトリ

Kyushu Institute of Technology Academic Repository

Menu

New Items

Link

Browse & Search

Language

インデックスツリー

Kyutacar　九州工業大学学術機関リポジトリ