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        <identifier>oai:kyutech.repo.nii.ac.jp:00006335</identifier>
        <datestamp>2024-08-05T07:52:55Z</datestamp>
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          <dc:title>Theoretical Estimation of the Upper Limit of Critical Current Density by Flux Pinning in Superconductors Under the Influence of Kinetic Energy</dc:title>
          <dc:title>Theoretical estimation of the upper limit of critical current density by flux pinning in superconductors under the influence of kinetic energy</dc:title>
          <dc:creator>Matsushita, Teruo</dc:creator>
          <dc:creator>633</dc:creator>
          <dc:creator>松下, 照男</dc:creator>
          <dc:creator>90038084</dc:creator>
          <dc:creator>マツシタ, テルオ</dc:creator>
          <dc:creator>7402307429</dc:creator>
          <dc:creator>Kiuchi, Masaru</dc:creator>
          <dc:creator>631</dc:creator>
          <dc:creator>木内, 勝</dc:creator>
          <dc:creator>90304758</dc:creator>
          <dc:creator>キウチ, マサル</dc:creator>
          <dc:creator>40661626600</dc:creator>
          <dc:creator>210</dc:creator>
          <dc:subject>427</dc:subject>
          <dc:subject>deparing current</dc:subject>
          <dc:subject>pair breaking current</dc:subject>
          <dc:subject>対破壊電流</dc:subject>
          <dc:description>The upper limit of critical current density by the flux pinning mechanism is theoretically investigated by taking into account the influence of kinetic energy. The upper limit is estimated to be 67% of the depairing current density in the London limit, which is about 23% higher than the estimation by Tinkham. The reason for the higher value is attributed to the enhancement of the order parameter that reduces the kinetic energy caused by the current. The possibility of such a strong flux pinning is discussed for nano-rods introduced to REBCO coated conductors.</dc:description>
          <dc:description>journal article</dc:description>
          <dc:publisher>IOP Publishing</dc:publisher>
          <dc:date>2019-01-18</dc:date>
          <dc:type>AM</dc:type>
          <dc:format>application/pdf</dc:format>
          <dc:identifier>Applied Physics Express</dc:identifier>
          <dc:identifier>2</dc:identifier>
          <dc:identifier>12</dc:identifier>
          <dc:identifier>023004</dc:identifier>
          <dc:identifier>AA12295133</dc:identifier>
          <dc:identifier>1882-0778</dc:identifier>
          <dc:identifier>1882-0786</dc:identifier>
          <dc:identifier>https://kyutech.repo.nii.ac.jp/record/6335/files/1882-0786_aaf787.pdf</dc:identifier>
          <dc:identifier>http://hdl.handle.net/10228/00007545</dc:identifier>
          <dc:identifier>https://kyutech.repo.nii.ac.jp/records/6335</dc:identifier>
          <dc:language>eng</dc:language>
          <dc:relation>https://doi.org/10.7567/1882-0786/aaf787</dc:relation>
          <dc:rights>Copyright (c) 2019 The Japan Society of Applied Physics</dc:rights>
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