{"created":"2023-05-15T11:55:57.903944+00:00","id":1072,"links":{},"metadata":{"_buckets":{"deposit":"dc39873e-df53-4372-9009-a19004bb1442"},"_deposit":{"created_by":3,"id":"1072","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"1072"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00001072","sets":["8:24"]},"author_link":["20416","4957","4958","4959","4960","4961","4962"],"control_number":"1072","item_1689815586683":{"attribute_name":"CRID","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://cir.nii.ac.jp/crid/1571698602559228288","subitem_relation_type_select":"URI"}}]},"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1990-08-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"3","bibliographicPageEnd":"1232","bibliographicPageStart":"1229","bibliographicVolumeNumber":"68","bibliographic_titles":[{"bibliographic_title":"Journal of Applied Physics","bibliographic_titleLang":"en"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Electronic structure of Nd2−xCexCuO4−y (x=0 and 0.15) thin films was examined by x-ray photoelectron spectroscopy. The films were prepared by rf magnetron sputtering and successive annealing under reducing condition (reduction). The reduced films showed semiconducting and superconducting behaviors depending on the value x. The Cu, O, and Nd core-level spectra revealed that the doped electrons were predominantly in CuO2 plane of the Nd2CuO4 crystal. The Cu core-level spectra from x=0.15 films before and after the reduction suggested that the reduction added electrons to Cu4s-O2p extended conduction band, and strengthened Cu O bond covalency to screen the core hole state by mobile itinerant electrons. Journal of Applied Physics is copyrighted by The American Institute of Physics.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_21_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"American Institute of Physics","subitem_publisher_language":"en"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1063/1.346722","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"Copyright © 1990 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_10":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_source_identifier":"AA00693547","subitem_source_identifier_type":"NCID"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1089-7550","subitem_source_identifier_type":"EISSN"},{"subitem_source_identifier":"0021-8979","subitem_source_identifier_type":"PISSN"}]},"item_21_text_64":{"attribute_name":"業績ID","attribute_value_mlt":[{"subitem_text_value":"10EBDBAFACDE53304925756100201FA0"}]},"item_21_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNames":[{}]}],"creatorNames":[{"creatorName":"Kohiki, Shigemi","creatorNameLang":"en"},{"creatorName":"古曵, 重美","creatorNameLang":"ja"},{"creatorName":"コヒキ, シゲミ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{}]},{"creatorNames":[{"creatorName":"Kawai, J","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hayashi, S","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Adachi, H","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hatta, S","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Setsune, K","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Wasa, K","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2009-02-20"}],"displaytype":"detail","filename":"kohiki_21.pdf","filesize":[{"value":"113.7 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"kohiki_21.pdf","url":"https://kyutech.repo.nii.ac.jp/record/1072/files/kohiki_21.pdf"},"version_id":"7d96fbf9-2085-4ed9-813b-854260b1a40a"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"neodymium oxides","subitem_subject_scheme":"Other"},{"subitem_subject":"cerium oxides","subitem_subject_scheme":"Other"},{"subitem_subject":"copper oxides","subitem_subject_scheme":"Other"},{"subitem_subject":"films","subitem_subject_scheme":"Other"},{"subitem_subject":"electronic structure","subitem_subject_scheme":"Other"},{"subitem_subject":"photoelectron spectroscopy","subitem_subject_scheme":"Other"},{"subitem_subject":"x radiation","subitem_subject_scheme":"Other"},{"subitem_subject":"sputtering","subitem_subject_scheme":"Other"},{"subitem_subject":"annealing","subitem_subject_scheme":"Other"},{"subitem_subject":"reduction","subitem_subject_scheme":"Other"},{"subitem_subject":"semiconductor materials","subitem_subject_scheme":"Other"},{"subitem_subject":"high&minus","subitem_subject_scheme":"Other"},{"subitem_subject":"tc superconductors","subitem_subject_scheme":"Other"},{"subitem_subject":"transition temperature","subitem_subject_scheme":"Other"},{"subitem_subject":"core levels","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"X‐ray photoelectron spectroscopy of Nd2−xCexCuO4−y (x=0 and 0.15) thin films","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"X‐ray photoelectron spectroscopy of Nd2−xCexCuO4−y (x=0 and 0.15) thin films","subitem_title_language":"en"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2009-02-20"},"publish_date":"2009-02-20","publish_status":"0","recid":"1072","relation_version_is_last":true,"title":["X‐ray photoelectron spectroscopy of Nd2−xCexCuO4−y (x=0 and 0.15) thin films"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2024-03-11T08:01:52.061812+00:00"}