{"created":"2023-05-15T11:55:58.643876+00:00","id":1086,"links":{},"metadata":{"_buckets":{"deposit":"b52b7a9f-4423-4953-9ba7-8d7fa31c7c63"},"_deposit":{"created_by":3,"id":"1086","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"1086"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00001086","sets":["8:24"]},"author_link":["5071","31450","5073","5074"],"control_number":"1086","item_1689815586683":{"attribute_name":"CRID","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://cir.nii.ac.jp/crid/1050564288863274112","subitem_relation_type_select":"URI"}}]},"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1995-04-25","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicPageEnd":"256","bibliographicPageStart":"250","bibliographicVolumeNumber":"J78-B-2","bibliographic_titles":[{"bibliographic_title":"電子情報通信学会論文誌. B-II, 通信II-無線通信・無線応用","bibliographic_titleLang":"ja"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"情報技術装置の放射イミュニティ試験では電波暗室・TEMセル・GTEMセル等の電磁界印加装置が使用されている.これらについて,供試機器のない場合の電界均一性等の特性は評価されているが,供試機器が存在する場合の電界分布等の特性は評価されていない.本論文では,これらの電磁界印加装置がいずれも平面波を模擬した電磁界を発生するように設計されている点に着目し,平面波が導体球に入射したときに周囲にできる電界分布を基準として,印加装置内に供試機器が設置された場合の電界分布を評価・比較した.更に,各印加装置内でイミュニティ試験が可能な供試機器の大きさについて評価した結果も示している.評価方法としては,まず自由空間中の導体球に平面波が入射したときの散乱電界理論値を求め,つぎにこの理論値と各電磁界印加装置内における導体球周囲の電界測定値を比較した.その結果,電波暗室の場合が最も理論値との偏差が小さく,かつ周波数による変動が少ないことがわかった.またTEMセル・GTMセルの場合,供試機器の大きさが内部導体の外部導体の間隔の1/3以下であれば,理論値と測定値との偏差は+6dB以下になることがわかった.","subitem_description_language":"ja","subitem_description_type":"Abstract"}]},"item_21_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"電子情報通信学会","subitem_publisher_language":"ja"}]},"item_21_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"電子情報通信学会. 本文データは学協会の許諾に基づきCiNiiから複製したものである"}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_10":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_source_identifier":"AA11359977","subitem_source_identifier_type":"NCID"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0915-1885","subitem_source_identifier_type":"PISSN"}]},"item_21_text_64":{"attribute_name":"業績ID","attribute_value_mlt":[{"subitem_text_value":"5CF42DD1A9E70BAD4925756100260D10"}]},"item_21_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"秋山, 佳春","creatorNameLang":"ja"},{"creatorName":"Akiyama, Yoshiharu","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"5071","nameIdentifierScheme":"WEKO"}]},{"creatorAffiliations":[{"affiliationNames":[{}]}],"creatorNames":[{"creatorName":"Kuwabara, Nobuo","creatorNameLang":"en"},{"creatorName":"桑原, 伸夫","creatorNameLang":"ja"},{"creatorName":"クワバラ, ノブオ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{"nameIdentifier":"31450","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"7005750067","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7005750067"}]},{"creatorNames":[{"creatorName":"井手口, 健","creatorNameLang":"ja"},{"creatorName":"Ideguchi, Tsuyoshi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"5073","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"徳田, 正満","creatorNameLang":"ja"},{"creatorName":"Tokuda, Masamitsu","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"5074","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2009-02-20"}],"displaytype":"detail","filename":"kuwabara_26.pdf","filesize":[{"value":"610.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"kuwabara_26.pdf","url":"https://kyutech.repo.nii.ac.jp/record/1086/files/kuwabara_26.pdf"},"version_id":"38556a2f-fad0-483b-b5bd-9c8ab7fa0c14"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"放射イミュニティ試験","subitem_subject_scheme":"Other"},{"subitem_subject":"電波暗室","subitem_subject_scheme":"Other"},{"subitem_subject":"TEMセル","subitem_subject_scheme":"Other"},{"subitem_subject":"GTEMセル","subitem_subject_scheme":"Other"},{"subitem_subject":"散乱電界","subitem_subject_scheme":"Other"},{"subitem_subject":"電界の均一性","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"導体球の散乱電界を用いた放射イミュニティ試験電磁界印加装置の特性評価","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"導体球の散乱電界を用いた放射イミュニティ試験電磁界印加装置の特性評価","subitem_title_language":"ja"},{"subitem_title":"Evaluation of RF Immunity Test Facilities Based on the Scattered Field of a Conductive Sphere","subitem_title_language":"en"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2009-02-20"},"publish_date":"2009-02-20","publish_status":"0","recid":"1086","relation_version_is_last":true,"title":["導体球の散乱電界を用いた放射イミュニティ試験電磁界印加装置の特性評価"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2024-06-07T07:44:16.571415+00:00"}