{"created":"2023-05-15T11:55:59.440158+00:00","id":1100,"links":{},"metadata":{"_buckets":{"deposit":"2f5f5403-ccd4-46ad-9167-7d59d1f27300"},"_deposit":{"created_by":3,"id":"1100","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"1100"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00001100","sets":["8:24"]},"author_link":["1164","5143","5146","5145","5141","5142"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2004-07-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicPageEnd":"2112","bibliographicPageStart":"2110","bibliographicVolumeNumber":"40","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Magnetics"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The pinning characteristics of a domain wall with a step-like thickness change along the wall is investigated in 0.15- to 0.5-mum-thick films with an in-plane anisotropy using micromagnetic simulation based on the Landau-Lifshitz-Gilbert equation. The asymmetric Bloch wall having the structure in which the magnetostatic coupling develops between spins near the step when the wall is pinned shows the bi-directional pinning effect for magnetic fields applied along the magnetic domain. The wall energy of the pinned wall decreases with increasing step depth due to the largely decrease of the exchange energy component. The depinning field for the negative applied fields which drive the wall in the direction of the nongrooved region (thick film region) is considerably larger than that for the positive ones which drive the wall in the direction of the grooved region (thin film region). The depinning fields for both the positive and negative applied fields increase with decreasing film thickness.","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"5146","nameIdentifierScheme":"WEKO"}],"names":[{"name":"山崎, 二郎"}]}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Institute of Electrical and Electronics Engineers"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1109/tmag.2004.832145","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"©2004 IEEE. Personal use of this material is permitted.However,permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, ore to reuse any copyrighted component of this work in other works must be obtained from the IEEE."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0018-9464","subitem_source_identifier_type":"ISSN"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Yamaguchi Univ, Grad Sch Sci & Engn, Dept Symbiot Environm Syst Engn"},{"subitem_text_value":"Kyushu Inst Technol, Dept Appl Sci Integrated Syst Engn, Grad Sch Engn"}]},"item_21_text_64":{"attribute_name":"業績ID","attribute_value_mlt":[{"subitem_text_value":"140761E382B2A89249257566002DD9A1"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Asada, H"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hyodo, Y"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yamasaki, J"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Takezawa, Masaaki","creatorNameLang":"en"},{"creatorName":"竹澤, 昌晃","creatorNameLang":"ja"},{"creatorName":"タケザワ, マサアキ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Koyanagi, T"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2009-02-23"}],"displaytype":"detail","filename":"yamasaki_10.pdf","filesize":[{"value":"221.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"yamasaki_10.pdf","url":"https://kyutech.repo.nii.ac.jp/record/1100/files/yamasaki_10.pdf"},"version_id":"a812cdb5-3f40-49e0-9983-baa90c85e692"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"domain wall pinning","subitem_subject_scheme":"Other"},{"subitem_subject":"groove","subitem_subject_scheme":"Other"},{"subitem_subject":"micromagnetic simulation","subitem_subject_scheme":"Other"},{"subitem_subject":"thickness variation","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Micromagnetic study of domain wall-pinning characteristics with step-like thickness change in thin film","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Micromagnetic study of domain wall-pinning characteristics with step-like thickness change in thin film"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-02-23"},"publish_date":"2009-02-23","publish_status":"0","recid":"1100","relation_version_is_last":true,"title":["Micromagnetic study of domain wall-pinning characteristics with step-like thickness change in thin film"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-10-25T07:15:19.845600+00:00"}