{"created":"2023-05-15T11:56:21.073842+00:00","id":1567,"links":{},"metadata":{"_buckets":{"deposit":"5688229b-8a10-4d13-9a84-e514eda06910"},"_deposit":{"created_by":3,"id":"1567","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"1567"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00001567","sets":["8:24"]},"author_link":["6290","6288","3419","6291"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1994-11-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"11","bibliographicPageEnd":"2164","bibliographicPageStart":"2162","bibliographicVolumeNumber":"41","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Electron Devices"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A system for analyzing low frequency light fluctuation is set up with a multi-channel detector and a few results are shown. The multi-channel detector includes a' PCD image sensor which has 256 Fig. 1. Configuration of light analyzing system. sensing elements. The light output of a laser diode is divided into various wavelengths and the light spectral intensities are obtained at various wavelengths. The current noise is also measured. The noises show 1/f spectra. The correlation coefficient between the light and the driving current is calculated from the measured values.","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Yang","familyNameLang":"en"},{"familyName":"楊","familyNameLang":"ja"},{"familyName":"ヨウ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Shiyuan","givenNameLang":"en"},{"givenName":"世淵","givenNameLang":"ja"},{"givenName":"セイエン","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"6291","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"20253552","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000020253552"},{"nameIdentifier":"35779642300","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=35779642300"},{"nameIdentifier":"84","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/84_ja.html"}],"names":[{"name":"Yang, Shiyuan","nameLang":"en"},{"name":"楊, 世淵","nameLang":"ja"},{"name":"ヨウ, セイエン","nameLang":"ja-Kana"}]}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Institute of Electrical and Electronics Engineers"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1109/16.333836","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"©1994 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0018-9383","subitem_source_identifier_type":"ISSN"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Fac. of Eng., Kyushu Inst. of Technol., Kitakyushu , Japan"}]},"item_21_text_64":{"attribute_name":"業績ID","attribute_value_mlt":[{"subitem_text_value":"2DC06C11BA620A4C4925759E0025D17B"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Yang, Shiyuan","creatorNameLang":"en"},{"creatorName":"楊, 世淵","creatorNameLang":"ja"},{"creatorName":"ヨウ, セイエン","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Sasaki, Tsuneki"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Mizunami, Toru","creatorNameLang":"en"},{"creatorName":"水波, 徹","creatorNameLang":"ja"},{"creatorName":"ミズナミ, トオル","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{}]},{"creatorNames":[{"creatorName":"Takagi, Keiji"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2009-04-20"}],"displaytype":"detail","filename":"16.333836.pdf","filesize":[{"value":"143.1 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"16.333836.pdf","url":"https://kyutech.repo.nii.ac.jp/record/1567/files/16.333836.pdf"},"version_id":"890bd30d-8387-490b-bf59-5c4016e98164"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Measurements on Low-Frequency Fluctuation in the Laser Diodes","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Measurements on Low-Frequency Fluctuation in the Laser Diodes"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-04-20"},"publish_date":"2009-04-20","publish_status":"0","recid":"1567","relation_version_is_last":true,"title":["Measurements on Low-Frequency Fluctuation in the Laser Diodes"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T07:19:49.455644+00:00"}