{"created":"2023-05-15T11:56:23.099474+00:00","id":1612,"links":{},"metadata":{"_buckets":{"deposit":"181bd264-f125-4818-8ad8-548260da9e5b"},"_deposit":{"created_by":3,"id":"1612","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"1612"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00001612","sets":["8:9"]},"author_link":["6452","6454","6453","572","631","633","6448","6455","6456"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2006-10-01","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"145","bibliographicPageStart":"141","bibliographicVolumeNumber":"445-448","bibliographic_titles":[{"bibliographic_title":"Physica C: Superconductivity and its Applications"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The dependence of superconducting layer thickness on the critical current characteristics was investigated in the range of 0.5–1.5 μm for YBCO-coated conductors made by the PLD process. Since the dimension of the pinning is considered to be three as indicated by the pinning correlation length, it is concluded that the observed thickness dependence of the critical current density at low fields come simply from a degradation in the superconducting layer structure with increasing thickness. The irreversibility field and the n-value increase with the thickness. These dependencies are well described by the theoretical model of the flux creep and flow.","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"小田部","familyNameLang":"ja"},{"familyName":"オタベ","familyNameLang":"ja-Kana"},{"familyName":"Otabe","familyNameLang":"en"}],"givenNames":[{"givenName":"エドモンド 荘司","givenNameLang":"ja"},{"givenName":"エドモンド ソウジ","givenNameLang":"ja-Kana"},{"givenName":"Edmund Soji","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"572","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"30231236","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000030231236"},{"nameIdentifier":"7003400054","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7003400054"},{"nameIdentifier":"0000-0001-9880-8240","nameIdentifierScheme":"ORCiD","nameIdentifierURI":"https://orcid.org/0000-0001-9880-8240"},{"nameIdentifier":"205","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/205_ja.html"}],"names":[{"name":"小田部, エドモンド 荘司","nameLang":"ja"},{"name":"オタベ, エドモンド ソウジ","nameLang":"ja-Kana"},{"name":"Otabe, Edmund Soji","nameLang":"en"}]}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Elsevier"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1016/j.physc.2006.03.102","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © 2006 Elsevier B.V. All rights reserved."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0921-4534","subitem_source_identifier_type":"ISSN"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology"},{"subitem_text_value":"Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology"},{"subitem_text_value":"Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology"},{"subitem_text_value":"Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology"},{"subitem_text_value":"Superconductivity Research Laboratory"},{"subitem_text_value":"Superconductivity Research Laboratory"},{"subitem_text_value":"Superconductivity Research Laboratory"},{"subitem_text_value":"Superconductivity Research Laboratory"},{"subitem_text_value":"Superconductivity Research Laboratory"}]},"item_21_text_64":{"attribute_name":"業績ID","attribute_value_mlt":[{"subitem_text_value":"A1C75B530327A7E549257600002C4C1B"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kimura, K"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kiuchi, Masaru","creatorNameLang":"en"},{"creatorName":"木内, 勝","creatorNameLang":"ja"},{"creatorName":"キウチ, マサル","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"小田部, エドモンド 荘司","creatorNameLang":"ja"},{"creatorName":"オタベ, エドモンド ソウジ","creatorNameLang":"ja-Kana"},{"creatorName":"Otabe, Edmund Soji","creatorNameLang":"en"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Matsushita, Teruo","creatorNameLang":"en"},{"creatorName":"松下, 照男","creatorNameLang":"ja"},{"creatorName":"マツシタ, テルオ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{}]},{"creatorNames":[{"creatorName":"Miyata, S"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ibi, A"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Muroga, T"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yamada, Y"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shiohara, Y"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2009-08-05"}],"displaytype":"detail","filename":"j.physc.2006.03.102.pdf","filesize":[{"value":"198.5 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"j.physc.2006.03.102.pdf","url":"https://kyutech.repo.nii.ac.jp/record/1612/files/j.physc.2006.03.102.pdf"},"version_id":"718b379b-384f-4fc5-91b7-1eef00f25a09"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Critical current density","subitem_subject_scheme":"Other"},{"subitem_subject":"YBCO-coated conductor","subitem_subject_scheme":"Other"},{"subitem_subject":"Superconducting layer thickness","subitem_subject_scheme":"Other"},{"subitem_subject":"n-value","subitem_subject_scheme":"Other"},{"subitem_subject":"Irreversibility field","subitem_subject_scheme":"Other"},{"subitem_subject":"Flux creep–flow model","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Film thickness dependence of critical current characteristics of YBCO-coated conductors","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Film thickness dependence of critical current characteristics of YBCO-coated conductors"}]},"item_type_id":"21","owner":"3","path":["9"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-08-05"},"publish_date":"2009-08-05","publish_status":"0","recid":"1612","relation_version_is_last":true,"title":["Film thickness dependence of critical current characteristics of YBCO-coated conductors"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2024-04-02T08:34:04.509875+00:00"}