{"created":"2023-05-15T11:56:23.392377+00:00","id":1619,"links":{},"metadata":{"_buckets":{"deposit":"38cb4c9f-d227-49e5-b0c2-ed67114d5f8f"},"_deposit":{"created_by":3,"id":"1619","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"1619"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00001619","sets":["8:9"]},"author_link":["6513","6515","572","631","6516","633","6514","6517"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-09-15","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"15-20","bibliographicPageEnd":"1446","bibliographicPageStart":"1443","bibliographicVolumeNumber":"468","bibliographic_titles":[{"bibliographic_title":"Physica C: Superconductivity"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Many recent reports on the critical current density (Jc) in superconducting MgB2 bulks indicated that improving the grain connectivity is important, since the obtained Jc values were generally much lower than those in other metallic superconductors and it was ascribed to the poor connectivity between grains in polycrystalline MgB2. In this study, we focused on the estimation of the global critical current density, super-current path, grain connectivity and their relationships with the faults volume fraction in the MgB2 bulks prepared by a modified PIT (powder in tube) method. Campbell’s method was applied for the purpose of obtaining the penetrating AC flux profile and the characteristic of AC magnetic field vs. penetration depth from the sample’s surface. A computer simulation on the penetrating AC flux profile in MgB2 bulks with randomly distributed voids, oxidized grains and other faults was also carried out. Jc obtained by Campbell’s method turned out to be smaller than that obtained from the SQUID measurement, implying that the global super-current was reduced by the existence of various faults and the lack of the electrical connectivity. It was verified that the relationship between the global critical current characteristics and the faults contained in MgB2 samples can be quantitatively clarified by comparing the simulated critical current densities and other factors with the experimental results.","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"小田部","familyNameLang":"ja"},{"familyName":"オタベ","familyNameLang":"ja-Kana"},{"familyName":"Otabe","familyNameLang":"en"}],"givenNames":[{"givenName":"エドモンド 荘司","givenNameLang":"ja"},{"givenName":"エドモンド ソウジ","givenNameLang":"ja-Kana"},{"givenName":"Edmund Soji","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"572","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"30231236","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000030231236"},{"nameIdentifier":"7003400054","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7003400054"},{"nameIdentifier":"0000-0001-9880-8240","nameIdentifierScheme":"ORCiD","nameIdentifierURI":"https://orcid.org/0000-0001-9880-8240"},{"nameIdentifier":"205","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/205_ja.html"}],"names":[{"name":"小田部, エドモンド 荘司","nameLang":"ja"},{"name":"オタベ, エドモンド ソウジ","nameLang":"ja-Kana"},{"name":"Otabe, Edmund Soji","nameLang":"en"}]}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Elsevier"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1016/j.physc.2008.05.242","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © 2008 Elsevier B.V. All rights reserved."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0921-4534","subitem_source_identifier_type":"ISSN"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Department of Life, Environment and Material Science, Fukuoka Institute of Technology"},{"subitem_text_value":"Department of Life, Environment and Material Science, Fukuoka Institute of Technology"},{"subitem_text_value":"Key Lab of New Processing Technology for Nonferrous Metals and Materials, Guilin University of Technology"},{"subitem_text_value":"Key Lab of New Processing Technology for Nonferrous Metals and Materials, Guilin University of Technology"},{"subitem_text_value":"Department of Computer Science and Electronics, Kyushu Institute of Technology"},{"subitem_text_value":"Department of Computer Science and Electronics, Kyushu Institute of Technology"},{"subitem_text_value":"Department of Computer Science and Electronics, Kyushu Institute of Technology"},{"subitem_text_value":"Department of Computer Science and Electronics, Kyushu Institute of Technology"}]},"item_21_text_64":{"attribute_name":"業績ID","attribute_value_mlt":[{"subitem_text_value":"DDCCA6142EF9684949257600002C4CC3"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Ni, B"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Morita, Y"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Liu, Z"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Liu, C"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Himeki, K"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"小田部, エドモンド 荘司","creatorNameLang":"ja"},{"creatorName":"オタベ, エドモンド ソウジ","creatorNameLang":"ja-Kana"},{"creatorName":"Otabe, Edmund Soji","creatorNameLang":"en"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kiuchi, Masaru","creatorNameLang":"en"},{"creatorName":"木内, 勝","creatorNameLang":"ja"},{"creatorName":"キウチ, マサル","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Matsushita, Teruo","creatorNameLang":"en"},{"creatorName":"松下, 照男","creatorNameLang":"ja"},{"creatorName":"マツシタ, テルオ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2009-08-05"}],"displaytype":"detail","filename":"Estimation.pdf","filesize":[{"value":"77.1 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"Estimation.pdf","url":"https://kyutech.repo.nii.ac.jp/record/1619/files/Estimation.pdf"},"version_id":"9b7b8712-2860-4c0e-9016-a1d6d9021c9a"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Polycrystalline MgB2 bulk","subitem_subject_scheme":"Other"},{"subitem_subject":"Campbell’s method","subitem_subject_scheme":"Other"},{"subitem_subject":"AC flux profile","subitem_subject_scheme":"Other"},{"subitem_subject":"Grain connectivity","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Estimation of critical current density and grain connectivity in superconducting MgB2 bulk using Campbell’s method","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Estimation of critical current density and grain connectivity in superconducting MgB2 bulk using Campbell’s method"}]},"item_type_id":"21","owner":"3","path":["9"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-08-05"},"publish_date":"2009-08-05","publish_status":"0","recid":"1619","relation_version_is_last":true,"title":["Estimation of critical current density and grain connectivity in superconducting MgB2 bulk using Campbell’s method"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2024-04-02T08:44:10.762091+00:00"}