WEKO3
アイテム
Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing
http://hdl.handle.net/10228/2472
http://hdl.handle.net/10228/2472af7a225e-04fa-42e6-9cd9-d3dcc9267f4d
| 名前 / ファイル | ライセンス | アクション |
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Low_capture.pdf (185.8 kB)
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| アイテムタイプ | 学術雑誌論文 = Journal Article(1) | |||||||||||||
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| 公開日 | 2009-09-09 | |||||||||||||
| 資源タイプ | ||||||||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||
| 資源タイプ | journal article | |||||||||||||
| タイトル | ||||||||||||||
| タイトル | Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing | |||||||||||||
| 言語 | en | |||||||||||||
| 言語 | ||||||||||||||
| 言語 | eng | |||||||||||||
| 著者 |
温, 暁青
× 温, 暁青× 宮瀬, 紘平
WEKO
6567
× Suzuki, Tatsuya× 梶原, 誠司× Wang, Laung-Terng× Saluja, K. Kewal× Kinoshita, Kozo |
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| 抄録 | ||||||||||||||
| 内容記述タイプ | Abstract | |||||||||||||
| 内容記述 | At-speed scan testing, based on ATPG and ATE, is indispensable to guarantee timing-related test quality in the DSM era. However, at-speed scan testing may incur yield loss due to excessive IR-drop caused by high test (shift & capture) switching activity. This paper discusses the mechanism of circuit malfunction due to IR-drop, and summarizes general approaches to reducing switching activity, by which highlights the problem of current solutions, i.e. only reducing switching activity for one capture while the widely used at-speed scan testing based on the launch-off-capture scheme uses two captures. This paper then proposes a novel X-filling method, called double-capture (DC) X-filling, for generating test vectors with low and balanced capture switching activity for two captures. Applicable to dynamic & static compaction in any ATPG system, DC X-filling can reduce IR-drop, and thus yield loss, without any circuit/clock modification, timing/circuit overhead, fault coverage loss, and additional design effort. | |||||||||||||
| 言語 | en | |||||||||||||
| 書誌情報 |
en : Journal of Electronic Testing 巻 24, 号 4, p. 379-391, 発行日 2008-08 |
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| 出版社 | ||||||||||||||
| 出版者 | Springer | |||||||||||||
| DOI | ||||||||||||||
| 関連タイプ | isVersionOf | |||||||||||||
| 識別子タイプ | DOI | |||||||||||||
| 関連識別子 | https://doi.org/10.1007/s10836-007-5033-3 | |||||||||||||
| ISSN | ||||||||||||||
| 収録物識別子タイプ | PISSN | |||||||||||||
| 収録物識別子 | 0923-8174 | |||||||||||||
| ISSN | ||||||||||||||
| 収録物識別子タイプ | EISSN | |||||||||||||
| 収録物識別子 | 1573-0727 | |||||||||||||
| 著作権関連情報 | ||||||||||||||
| 権利情報 | Copyright (c) Springer Science + Business Media, LLC 2007. This is a post-peer-review, pre-copyedit version of an article published in Journal of Electronic Testing. The final authenticated version is available online at: https://doi.org/10.1007/s10836-007-5033-3. | |||||||||||||
| キーワード | ||||||||||||||
| 主題Scheme | Other | |||||||||||||
| 主題 | At-speed scan testing | |||||||||||||
| キーワード | ||||||||||||||
| 主題Scheme | Other | |||||||||||||
| 主題 | Capture switching activity | |||||||||||||
| キーワード | ||||||||||||||
| 主題Scheme | Other | |||||||||||||
| 主題 | X-filling | |||||||||||||
| キーワード | ||||||||||||||
| 主題Scheme | Other | |||||||||||||
| 主題 | Test cube | |||||||||||||
| キーワード | ||||||||||||||
| 主題Scheme | Other | |||||||||||||
| 主題 | ATPG | |||||||||||||
| キーワード | ||||||||||||||
| 主題Scheme | Other | |||||||||||||
| 主題 | Low power testing | |||||||||||||
| 出版タイプ | ||||||||||||||
| 出版タイプ | AM | |||||||||||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||||
| 査読の有無 | ||||||||||||||
| 値 | yes | |||||||||||||
| 業績ID | ||||||||||||||
| 値 | 0CD8513A439455F34925762B001D2437 | |||||||||||||
