{"created":"2023-05-15T11:56:23.767886+00:00","id":1628,"links":{},"metadata":{"_buckets":{"deposit":"4fe440b0-92f9-4170-8b3a-452e18c297ec"},"_deposit":{"created_by":3,"id":"1628","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"1628"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00001628","sets":["8:24"]},"author_link":["6568","1147","6571","6570","6567","6572","1143"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-08","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicPageEnd":"391","bibliographicPageStart":"379","bibliographicVolumeNumber":"24","bibliographic_titles":[{"bibliographic_title":"Journal of Electronic Testing"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"At-speed scan testing, based on ATPG and ATE, is indispensable to guarantee timing-related test quality in the DSM era. However, at-speed scan testing may incur yield loss due to excessive IR-drop caused by high test (shift & capture) switching activity. This paper discusses the mechanism of circuit malfunction due to IR-drop, and summarizes general approaches to reducing switching activity, by which highlights the problem of current solutions, i.e. only reducing switching activity for one capture while the widely used at-speed scan testing based on the launch-off-capture scheme uses two captures. This paper then proposes a novel X-filling method, called double-capture (DC) X-filling, for generating test vectors with low and balanced capture switching activity for two captures. Applicable to dynamic & static compaction in any ATPG system, DC X-filling can reduce IR-drop, and thus yield loss, without any circuit/clock modification, timing/circuit overhead, fault coverage loss, and additional design effort.","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal 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Xiaoqing","nameLang":"en"},{"name":"温, 暁青","nameLang":"ja"},{"name":"オン, ギョウセイ","nameLang":"ja-Kana"}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Kajihara","familyNameLang":"en"},{"familyName":"梶原","familyNameLang":"ja"},{"familyName":"カジハラ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Seiji","givenNameLang":"en"},{"givenName":"誠司","givenNameLang":"ja"},{"givenName":"セイジ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"1147","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"80252592","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000080252592"},{"nameIdentifier":"7005061314","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7005061314"},{"nameIdentifier":"201","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html"}],"names":[{"name":"Kajihara, Seiji","nameLang":"en"},{"name":"梶原, 誠司","nameLang":"ja"},{"name":"カジハラ, セイジ","nameLang":"ja-Kana"}]}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Springer"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1007/s10836-007-5033-3","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"The original publication is available at www.springer.com"}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0923-8174","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"1573-0727","subitem_source_identifier_type":"ISSN"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Denso Techno Co."},{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"SynTest Technologies, Inc."},{"subitem_text_value":"University of Wisconsin–Madison"},{"subitem_text_value":"Osaka Gakuin University"}]},"item_21_text_64":{"attribute_name":"業績ID","attribute_value_mlt":[{"subitem_text_value":"0CD8513A439455F34925762B001D2437"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Miyase, Kohei","creatorNameLang":"en"},{"creatorName":"宮瀬, 紘平","creatorNameLang":"ja"},{"creatorName":"ミヤセ, コウヘイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Suzuki, Tatsuya"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Wang, Laung-Terng"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Saluja, K. Kewal"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kinoshita, Kozo"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2009-09-09"}],"displaytype":"detail","filename":"Low_capture.pdf","filesize":[{"value":"185.8 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"Low_capture.pdf","url":"https://kyutech.repo.nii.ac.jp/record/1628/files/Low_capture.pdf"},"version_id":"90e15324-1aa9-4850-9d70-1c9e14d52808"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"At-speed scan testing","subitem_subject_scheme":"Other"},{"subitem_subject":"Capture switching activity","subitem_subject_scheme":"Other"},{"subitem_subject":"X-filling","subitem_subject_scheme":"Other"},{"subitem_subject":"Test cube","subitem_subject_scheme":"Other"},{"subitem_subject":"ATPG","subitem_subject_scheme":"Other"},{"subitem_subject":"Low power testing","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-09-09"},"publish_date":"2009-09-09","publish_status":"0","recid":"1628","relation_version_is_last":true,"title":["Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T08:56:54.393136+00:00"}