{"created":"2023-05-15T11:56:24.740332+00:00","id":1651,"links":{},"metadata":{"_buckets":{"deposit":"c3ddffa0-a74f-4f97-81df-1bf99a5e9e86"},"_deposit":{"created_by":3,"id":"1651","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"1651"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00001651","sets":["8:9"]},"author_link":["6681","6683","6680","6679","6685","6678","572","6686","6677","6682"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageStart":"012005","bibliographicVolumeNumber":"97","bibliographic_titles":[{"bibliographic_title":"Journal of Physics: Conference Series"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A precise and generalisable non-destructive measurement technique is required for evaluation of critical current density JC and electric field E vs. current density J properties in large-area and long-length high-temperature superconducting films. We measured E-J properties of a 2-inch phi Y-123 standard film for the calibration of our inductive measurement system using the third-harmonic voltage method. With adoption of a wideband-RL-cancel circuit, frequency normalised third-harmonic resistance contained noise less than 0.2 μΩs and power-law E-J dependencies were in the relatively wide electric field range of 1.4×10-6-1.6×10-4 V/m. Critical current density JC at 10-4 V/m on 7 different positions changed from an average of 2.839×1010A/m2 by a maximum of ±0.52%. As the JC distribution was also included, the maximum error margin of JC became remarkably small in the V3 inductive method. E-J properties of a 20×20mm square Dy-123 film agreed well with the properties measured by another research group. JC at 10-4 V/m and n value were 2.23×1010 A/m2 and 26.74 on the average of four different positions, with estimated systematic errors of -8.6% and +1.4%, respectively, by comparison of the averages of 16 positions measured by the same research group.","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"小田部","familyNameLang":"ja"},{"familyName":"オタベ","familyNameLang":"ja-Kana"},{"familyName":"Otabe","familyNameLang":"en"}],"givenNames":[{"givenName":"エドモンド 荘司","givenNameLang":"ja"},{"givenName":"エドモンド ソウジ","givenNameLang":"ja-Kana"},{"givenName":"Edmund Soji","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"572","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"30231236","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000030231236"},{"nameIdentifier":"7003400054","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7003400054"},{"nameIdentifier":"0000-0001-9880-8240","nameIdentifierScheme":"ORCiD","nameIdentifierURI":"https://orcid.org/0000-0001-9880-8240"},{"nameIdentifier":"205","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/205_ja.html"}],"names":[{"name":"小田部, エドモンド 荘司","nameLang":"ja"},{"name":"オタベ, エドモンド ソウジ","nameLang":"ja-Kana"},{"name":"Otabe, Edmund Soji","nameLang":"en"}]}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IOP 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Ltd"}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1742-6596","subitem_source_identifier_type":"ISSN"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Maizuru National College of Technology, Electrical and Computer Engineering"},{"subitem_text_value":"Maizuru National College of Technology, Electrical and Computer Engineering"},{"subitem_text_value":"Maizuru National College of Technology, Electrical and Computer Engineering"},{"subitem_text_value":"Maizuru National College of Technology, Electrical and Computer Engineering"},{"subitem_text_value":"Maizuru National College of Technology, Electrical and Computer Engineering"},{"subitem_text_value":"Maizuru National College of Technology, Electrical and Computer Engineering"},{"subitem_text_value":"Maizuru National College of Technology, Electrical and Computer Engineering"},{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"National Institute of Advanced Industrial Science and Technology"},{"subitem_text_value":"National Institute of Advanced Industrial Science and Technology"}]},"item_21_text_64":{"attribute_name":"業績ID","attribute_value_mlt":[{"subitem_text_value":"104D2033241B2DE74925763B00263646"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yamada, H"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Minakuchi, T"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Furuta, T"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takegami, K"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nakagawa, S"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kanayama, K"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hirachi, K"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"小田部, エドモンド 荘司","creatorNameLang":"ja"},{"creatorName":"オタベ, エドモンド ソウジ","creatorNameLang":"ja-Kana"},{"creatorName":"Otabe, Edmund Soji","creatorNameLang":"en"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{},{}]},{"creatorNames":[{"creatorName":"Mawatari, Y"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yamasaki, H"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2009-09-24"}],"displaytype":"detail","filename":"Wideband.pdf","filesize":[{"value":"434.5 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"Wideband.pdf","url":"https://kyutech.repo.nii.ac.jp/record/1651/files/Wideband.pdf"},"version_id":"36af3325-cb5a-4537-b4a1-eb5b7994045a"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Wideband-RL-cancel circuit for the E-J property measurement using the third-harmonic voltage method","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Wideband-RL-cancel circuit for the E-J property measurement using the third-harmonic voltage method"}]},"item_type_id":"21","owner":"3","path":["9"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-09-24"},"publish_date":"2009-09-24","publish_status":"0","recid":"1651","relation_version_is_last":true,"title":["Wideband-RL-cancel circuit for the E-J property measurement using the third-harmonic voltage method"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2024-04-02T08:45:42.420652+00:00"}