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Experimental investigation of total electron emission yield of polyimide film under various temperatures
http://hdl.handle.net/10228/0002000256
http://hdl.handle.net/10228/0002000256064a9206-8d72-459d-9d25-6c2a2469ed2e
| 名前 / ファイル | ライセンス | アクション |
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| Item type | 学術雑誌論文 = Journal Article(1) | |||||||||||||||||||||
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| 公開日 | 2023-11-14 | |||||||||||||||||||||
| 資源タイプ | ||||||||||||||||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||||||||||
| 資源タイプ | journal article | |||||||||||||||||||||
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| タイトル | Experimental investigation of total electron emission yield of polyimide film under various temperatures | |||||||||||||||||||||
| 言語 | en | |||||||||||||||||||||
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| 言語 | eng | |||||||||||||||||||||
| 著者 |
Wu, Jiang
× Wu, Jiang
× Li, Shuaiqiang
× Zhang, Bo
× Cao, Wen
× Li, Yunhong
× 豊田, 和弘
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| 内容記述タイプ | Abstract | |||||||||||||||||||||
| 内容記述 | As the thermal variation may change the total electron emission yield (TEEY) of materials and may ultimately result in unexpected surface charging, it is necessary to study the TEEY at various temperatures. In this research, we first updated the TEEY measurement system with a newly designed sample stage for different temperatures (−50, 25, and 100 °C) and the primary electron from 25 eV to 10 keV. By using the 30 μs/20 nA primary electron beam and sample scanning method to mitigate surface charging, the TEEY could be accurately obtained for dielectrics. Then, we chose a kind of polyimide film (Kapton 100H) used on spacecraft and a gold film sample to compare the TEEY at various temperatures. The results show that high temperature leads to higher TEEY of Kapton films, whereas 25 and −50 °C also leads to the same. On the other hand, the TEEY of gold remains the same at different temperatures. In the view of surface hole density and charge transportation, the TEEY variation of Kapton films was analyzed by bulk conduction, charge mobility, and the electron–hole recombination property. It is considered that the dissipation rate of holes is sensitive to temperature, and furthermore, the TEEY of Kapton films is dependent on temperature. | |||||||||||||||||||||
| 言語 | en | |||||||||||||||||||||
| 書誌情報 |
en : AIP Advances 巻 12, 号 7, p. 075321, 発行日 2022-07-26 |
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| 出版者 | American Institute of Physics | |||||||||||||||||||||
| 言語 | en | |||||||||||||||||||||
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| 識別子タイプ | DOI | |||||||||||||||||||||
| 関連識別子 | https://doi.org/10.1063/5.0099310 | |||||||||||||||||||||
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| 収録物識別子タイプ | EISSN | |||||||||||||||||||||
| 収録物識別子 | 2158-3226 | |||||||||||||||||||||
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| 権利情報Resource | http://creativecommons.org/licenses/by/4.0/ | |||||||||||||||||||||
| 権利情報 | Copyright (c) 2022 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CCBY) license. | |||||||||||||||||||||
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| 出版タイプ | VoR | |||||||||||||||||||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||||||||||||||||
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| 値 | yes | |||||||||||||||||||||