{"created":"2023-12-06T01:30:10.603301+00:00","id":2000308,"links":{},"metadata":{"_buckets":{"deposit":"2d2bd127-c57e-4674-8a8d-68a637dcb554"},"_deposit":{"created_by":14,"id":"2000308","owner":"14","owners":[14],"pid":{"revision_id":0,"type":"depid","value":"2000308"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:02000308","sets":["8:24"]},"author_link":["21156","16176"],"control_number":"2000308","item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2021-12-06","bibliographicIssueDateType":"Issued"},"bibliographicPageStart":"114289","bibliographicVolumeNumber":"126","bibliographic_titles":[{"bibliographic_title":"Microelectronics Reliability","bibliographic_titleLang":"en"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The shoot-through fault in inverters results from a gate noise voltage of power semiconductor switches including IGBTs. Testing the gate voltage under the high-speed switching event is important to evaluate immunity to the fault as well as to analyze the mechanism of the fault. This paper presents a testing method of shoot-through immunity in a PWM inverter consisting of IGBTs because the conventional double-pulse test can miss the shoot-through fault in the inverter. Theoretical analysis reveals that the N-base charge has influence on the gate-emitter voltage in the IGBT, which disturbs evaluating the shoot-through immunity in the inverter. This implies that IGBTs have a different characteristic from MOSFETs when the double-pulse test is carried out. The testing method introduces an additional pulse into the off-state IGBT to release the N-base charge, the circuit operation of which is the same as the inverter. Experimental results confirmed that the method did not affected by the N-base voltage, so that it is applicable to testing the shoot-through immunity of IGBTs in an inverter.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_21_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"Elsevier"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1016/j.microrel.2021.114289","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2021 Elsevier Ltd. All rights reserved."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1872-941X","subitem_source_identifier_type":"EISSN"},{"subitem_source_identifier":"0026-2714","subitem_source_identifier_type":"PISSN"}]},"item_21_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Hasegawa, K.","creatorNameLang":"en"}]},{"creatorNames":[{"creatorName":"Abe, Seiya","creatorNameLang":"en"},{"creatorName":"安部, 征哉","creatorNameLang":"ja"}],"familyNames":[{"familyName":"Abe","familyNameLang":"en"},{"familyName":"安部","familyNameLang":"ja"}],"givenNames":[{"givenName":"Seiya","givenNameLang":"en"},{"givenName":"征哉","givenNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"21156","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"7403335387","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7403335387"},{"nameIdentifier":"100000750","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/##_ja.html"}]},{"creatorNames":[{"creatorName":"Tsukuda, M.","creatorNameLang":"en"}]},{"creatorNames":[{"creatorName":"Omura, Ichiro","creatorNameLang":"en"},{"creatorName":"大村, 一郎","creatorNameLang":"ja"}],"familyNames":[{"familyName":"Omura","familyNameLang":"en"},{"familyName":"大村","familyNameLang":"ja"}],"givenNames":[{"givenName":"Ichiro","givenNameLang":"en"},{"givenName":"一郎","givenNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"16176","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"10510670","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000010510670"},{"nameIdentifier":"7003814580","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7003814580"},{"nameIdentifier":"69","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/##_ja.html"}]},{"creatorNames":[{"creatorName":"Ninomiya, T.","creatorNameLang":"en"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_access","date":[{"dateType":"Available","dateValue":"2023-12-06"}],"filename":"nperc191.pdf","filesize":[{"value":"513 KB"}],"format":"application/pdf","mimetype":"application/pdf","url":{"url":"https://kyutech.repo.nii.ac.jp/record/2000308/files/nperc191.pdf"},"version_id":"32b3c453-d5db-40d2-8cf8-29fcef94a482"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"A testing method for evaluating shoot-through immunity of IGBTs in an inverter","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"A testing method for evaluating shoot-through immunity of IGBTs in an inverter","subitem_title_language":"en"}]},"item_type_id":"21","owner":"14","path":["24"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2023-12-06"},"publish_date":"2023-12-06","publish_status":"0","recid":"2000308","relation_version_is_last":true,"title":["A testing method for evaluating shoot-through immunity of IGBTs in an inverter"],"weko_creator_id":"14","weko_shared_id":-1},"updated":"2025-07-14T02:26:14.896831+00:00"}