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アイテム
GPU-Accelerated Estimation and Targeted Reduction of Peak IR-Drop during Scan Chain Shifting
http://hdl.handle.net/10228/0002001004
http://hdl.handle.net/10228/00020010049b5f08bf-39e4-4af1-b5a9-9e9e99526174
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
10441923.pdf (1.5 MB)
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| アイテムタイプ | 学術雑誌論文 = Journal Article(1) | |||||||
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| 公開日 | 2024-11-05 | |||||||
| 資源タイプ | ||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||
| 資源タイプ | journal article | |||||||
| タイトル | ||||||||
| タイトル | GPU-Accelerated Estimation and Targeted Reduction of Peak IR-Drop during Scan Chain Shifting | |||||||
| 言語 | en | |||||||
| その他のタイトル | ||||||||
| その他のタイトル | GPU-Accelerated Estimation and Targeted Reduction of Peak IR-Drop during Scan Chain Shifting<sup>∗</sup> | |||||||
| 言語 | en | |||||||
| 言語 | ||||||||
| 言語 | eng | |||||||
| 著者 |
Shi, Shiling
× Shi, Shiling
× ホルスト, シュテファン× 温, 暁青 |
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| 抄録 | ||||||||
| 内容記述タイプ | Abstract | |||||||
| 内容記述 | High power dissipation during scan test often causes undue yield loss, especially for low-power circuits. One major reason is that the resulting IR-drop in shift mode may corrupt test data. A common approach to solving this problem is partial-shift, in which multiple scan chains are formed and only one group of scan chains is shifted at a time. However, existing partial-shift based methods suffer from two major problems: (1) their IR-drop estimation is not accurate enough or computationally too expensive to be done for each shift cycle; (2) partial-shift is hence applied to all shift cycles, resulting in long test time. This paper addresses these two problems with a novel IR-drop-aware scan shift method, featuring: (1) Cycle-based IR-Drop Estimation (CIDE) supported by a GPU-accelerated dynamic power simulator to quickly find potential shift cycles with excessive peak IR-drop; (2) a scan shift scheduling method that generates a scan chain grouping targeted for each considered shift cycle to reduce the impact on test time. Experiments on ITC'99 benchmark circuits show that: (1) the CIDE is computationally feasible; (2) the proposed scan shift schedule can achieve a global peak IR-drop reduction of up to 47%. Its scheduling efficiency is 58.4% higher than that of an existing typical method on average, which means our method has less test time. | |||||||
| 言語 | en | |||||||
| 書誌情報 |
en : IEICE Transactions on Information and Systems 巻 E106.D, 号 10, p. 1694-1704, 発行日 2023-10-01 |
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| 出版社 | ||||||||
| 出版者 | 電子情報通信学会 | |||||||
| 言語 | ja | |||||||
| DOI | ||||||||
| 関連タイプ | isVersionOf | |||||||
| 識別子タイプ | DOI | |||||||
| 関連識別子 | https://doi.org/10.1587/transinf.2023EDP7011 | |||||||
| NCID | ||||||||
| 収録物識別子タイプ | NCID | |||||||
| 収録物識別子 | AA10826272 | |||||||
| ISSN | ||||||||
| 収録物識別子タイプ | PISSN | |||||||
| 収録物識別子 | 0916-8532 | |||||||
| ISSN | ||||||||
| 収録物識別子タイプ | EISSN | |||||||
| 収録物識別子 | 1745-1361 | |||||||
| 著作権関連情報 | ||||||||
| 権利情報 | Copyright (c) 2023 The Institute of Electronics, Information and Communication Engineers | |||||||
| キーワード | ||||||||
| 主題Scheme | Other | |||||||
| 主題 | shift switching activity | |||||||
| キーワード | ||||||||
| 主題Scheme | Other | |||||||
| 主題 | peak IR-drop | |||||||
| キーワード | ||||||||
| 主題Scheme | Other | |||||||
| 主題 | shift failure | |||||||
| キーワード | ||||||||
| 主題Scheme | Other | |||||||
| 主題 | GPU-acceleration | |||||||
| キーワード | ||||||||
| 主題Scheme | Other | |||||||
| 主題 | partial-shift | |||||||
| 出版タイプ | ||||||||
| 出版タイプ | VoR | |||||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||
| 査読の有無 | ||||||||
| 値 | yes | |||||||
| 研究者情報 | ||||||||
| URL | https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html | |||||||
| 研究者情報 | ||||||||
| URL | https://hyokadb02.jimu.kyutech.ac.jp/html/100000663_ja.html | |||||||
| 論文ID（連携） | ||||||||
| 値 | 10441923 | |||||||
| 連携ID | ||||||||
| 値 | 12427 | |||||||
