| アイテムタイプ |
共通アイテムタイプ(1) |
| 公開日 |
2025-01-31 |
| タイトル |
|
|
タイトル |
Power-cycling degradation monitoring of an IGBT module with VCE(sat) measurement in continuous operation of a chopper circuit |
|
言語 |
en |
| その他のタイトル |
|
|
その他のタイトル |
Power-cycling degradation monitoring of an IGBT module with V<inf>CE(sat)</inf> measurement in continuous operation of a chopper circuit |
|
言語 |
en |
| 著者 |
長谷川, 一徳
Hara, Kanta
Shishido, Nobuyuki
Nakano, Satoshi
Saito, Wataru
Ninomiya, Tamotsu
|
| 著作権関連情報 |
|
|
権利情報Resource |
http://creativecommons.org/licenses/by/4.0/ |
|
権利情報 |
Copyright (c) 2024 The Author(s). Published by Elsevier Ltd. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/). |
| 抄録 |
|
|
内容記述タイプ |
Abstract |
|
内容記述 |
This paper presents a power-cycling degradation monitoring method of an IGBT module with a VCE(sat) sensing circuit and junction temperature prediction by a three-dimensional structure model. A chopper circuit was introduced to provide a continuous-current-conducting operation of the IGBT module. The VCE(sat) sensing circuit with a low-cost IoT platform “Leafony” was utilized to monitor the junction temperature of an IGBT chip, which transferred the measured signal as digital data, and thus obtained a higher noise immunity than an analog-based circuit. The junction temperature of IGBT chip in the power module was analyzed from the dissipated power of IGBT and the transient thermal impedance between the chips and the ambient. This analysis is effective not only to observe the degradation but also to estimate the thermal resistance. Comparing the temperature profile between experiment and prediction provides health condition of the IGBT model.
Predicted thermal profiles agreed with measured ones with 10 % increase of thermal resistance, which was degraded by a power cycle tester. From these results, the proposed monitoring method is effective to detect the progress of power cycle degradation. |
|
言語 |
en |
| 書誌情報 |
en : Power Electronic Devices and Components
巻 7,
p. 100061,
発行日 2024-02-23
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| 出版社 |
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出版者 |
Elsevier |
| キーワード |
|
|
主題Scheme |
Other |
|
主題 |
IGBTs |
| キーワード |
|
|
主題Scheme |
Other |
|
主題 |
Condition monitoring |
| キーワード |
|
|
主題Scheme |
Other |
|
主題 |
Power cycle degradation |
| キーワード |
|
|
主題Scheme |
Other |
|
主題 |
VCE(sat) measurement |
| キーワード |
|
|
主題Scheme |
Other |
|
主題 |
Temperature profile |
| 言語 |
|
|
言語 |
eng |
| 資源タイプ |
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|
資源タイプ識別子 |
http://purl.org/coar/resource_type/c_6501 |
|
資源タイプ |
journal article |
| 出版タイプ |
|
|
出版タイプ |
VoR |
|
出版タイプResource |
http://purl.org/coar/version/c_970fb48d4fbd8a85 |
| DOI |
|
|
|
識別子タイプ |
DOI |
|
|
関連識別子 |
https://doi.org/10.1016/j.pedc.2024.100061 |
| ISSN |
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収録物識別子タイプ |
EISSN |
|
収録物識別子 |
2772-3704 |
| 査読の有無 |
|
|
値 |
yes |
| 研究者情報 |
|
|
URL |
https://hyokadb02.jimu.kyutech.ac.jp/html/100000664_ja.html |
| 論文ID（連携） |
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|
値 |
10444522 |
| 連携ID |
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|
値 |
12625 |
10444522.pdf (6.2 MB)
