{"created":"2023-05-15T11:55:20.394754+00:00","id":223,"links":{},"metadata":{"_buckets":{"deposit":"3dce5ffe-2615-42c9-b311-156b6999a57a"},"_deposit":{"created_by":3,"id":"223","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"223"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00000223","sets":["8:9"]},"author_link":["1091","1090","572","631","633","1089","1088","1094","1096"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2001-09","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"Part 1","bibliographicPageEnd":"585","bibliographicPageStart":"582","bibliographicVolumeNumber":"357-360","bibliographic_titles":[{"bibliographic_title":"Physica C: Superconductivity"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The E–J characteristics are measured for a Bi-2223 silver-sheathed tape wire using the four probe method and a relaxation method of DC magnetization in the high and low electric field regions, respectively. The obtained results in the two regions are approximately explained by a theoretical analysis based on the flux creep-flow model in which the distribution of flux pinning strength is taken into account. It was found that the value of the pinning force density and its peak magnetic field are largely different between the two measurements.","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"小田部","familyNameLang":"ja"},{"familyName":"オタベ","familyNameLang":"ja-Kana"},{"familyName":"Otabe","familyNameLang":"en"}],"givenNames":[{"givenName":"エドモンド 荘司","givenNameLang":"ja"},{"givenName":"エドモンド ソウジ","givenNameLang":"ja-Kana"},{"givenName":"Edmund 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University, 6-10-1 Hakozaki, Higashi-ku, Fukuoka 812-8581, Japan"},{"subitem_text_value":"Department of Computer Science and Electronics, Kyushu Institute of Technology, 680-4 Kawazu, Iizuka 820-8502, Japan"},{"subitem_text_value":"Department of Electrical and Electronic Systems Engineering, Graduate School of Information Science and Electrical Engineering, Kyushu University, 6-10-1 Hakozaki, Higashi-ku, Fukuoka 812-8581, Japan"},{"subitem_text_value":"Department of Electrical and Electronic Systems Engineering, Graduate School of Information Science and Electrical Engineering, Kyushu University, 6-10-1 Hakozaki, Higashi-ku, Fukuoka 812-8581, Japan"},{"subitem_text_value":"Department of Computer Science and Electronics, Kyushu Institute of Technology, 680-4 Kawazu, Iizuka 820-8502, Japan"},{"subitem_text_value":"National Research Institute for Metals, 1-2-1 Sengen, Tsukuba 305-0047, Japan"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kodama, T."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Fukuda, M."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shiraishi, K."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nishimura, S."}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"小田部, エドモンド 荘司","creatorNameLang":"ja"},{"creatorName":"オタベ, エドモンド ソウジ","creatorNameLang":"ja-Kana"},{"creatorName":"Otabe, Edmund 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