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IEEE International Conference on Design & Test of Integrated Systems in Nanoscale Technology, pp.240-243, 2006, ©2006 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE / 登録別刷論文(4)A Framework of High-quality Transition Fault ATPG for Scan Circuits, Proc. International Test Conference, paper 2.1, 2006, ©2006 IEEE. Personal use of this material is permitted. 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