@article{oai:kyutech.repo.nii.ac.jp:00000251,
 author = {Wada, H and 小田部, エドモンド 荘司 and Otabe, Edmund Soji and Matsushita, Teruo and 松下, 照男 and Yasuda, Takashi and 安田, 敬 and Uchiyama, T and Iguchi, I and Wang, Z},
 issue = {1},
 journal = {Physica C: Superconductivity},
 month = {Oct},
 note = {The irreversibility field along the c-axis was measured for four Bi-2212 thin films and two Bi-2212 single crystals with different thicknesses. The irreversibility field at the same reduced temperature decreased as the thickness decreased. This result suggests that flux lines are fairly strongly coupled along their length over the distance longer than the film thickness investigated here even in two-dimensional superconductor. The thickness dependence is theoretically explained by the flux creep-flow model. From a difference of critical current property between thin films and single crystals, a critical thickness was found for the dimensional crossover of flux lines.},
 pages = {570--574},
 title = {Thickness dependence of irreversibility field in Bi-2212 thin films},
 volume = {378-381},
 year = {2002},
 yomi = {オタベ, エドモンド ソウジ and マツシタ, テルオ and ヤスダ, タカシ}
}