{"created":"2023-05-15T11:55:21.560001+00:00","id":251,"links":{},"metadata":{"_buckets":{"deposit":"31b8b95f-9e41-418c-b2a9-02a56bf3d11e"},"_deposit":{"created_by":3,"id":"251","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"251"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00000251","sets":["8:9"]},"author_link":["1247","572","1246","1248","633","1242","634"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2002-10-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"574","bibliographicPageStart":"570","bibliographicVolumeNumber":"378-381","bibliographic_titles":[{"bibliographic_title":"Physica C: Superconductivity"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The irreversibility field along the c-axis was measured for four Bi-2212 thin films and two Bi-2212 single crystals with different thicknesses. The irreversibility field at the same reduced temperature decreased as the thickness decreased. This result suggests that flux lines are fairly strongly coupled along their length over the distance longer than the film thickness investigated here even in two-dimensional superconductor. The thickness dependence is theoretically explained by the flux creep-flow model. From a difference of critical current property between thin films and single crystals, a critical thickness was found for the dimensional crossover of flux lines.","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"小田部","familyNameLang":"ja"},{"familyName":"オタベ","familyNameLang":"ja-Kana"},{"familyName":"Otabe","familyNameLang":"en"}],"givenNames":[{"givenName":"エドモンド 荘司","givenNameLang":"ja"},{"givenName":"エドモンド ソウジ","givenNameLang":"ja-Kana"},{"givenName":"Edmund 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Computer Science and Systems Engineering, Kyushu Institute of Technology, 680-4 Kawazu, Iizuka 820-8502, Japan"},{"subitem_text_value":"Tokyo Institute of Technology, 2-12-1, Ookayama, Meguro-ku, Tokyo 152-8551, Japan"},{"subitem_text_value":"Tokyo Institute of Technology, 2-12-1, Ookayama, Meguro-ku, Tokyo 152-8551, Japan"},{"subitem_text_value":"Communications Research Laboratory, Kansai Advanced Research Center, 588-2, Iwaoka, Iwaoka-chou, Nishi-ku, Kobe 651-2492, Japan"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Wada, H"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"小田部, エドモンド 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