@article{oai:kyutech.repo.nii.ac.jp:00000252,
 author = {Kodama, T and Fukuda, M and Nishimura, S and 小田部, エドモンド 荘司 and Otabe, Edmund Soji and Kiuchi, Masaru and 木内, 勝 and Kiss, T and Matsushita, Teruo and 松下, 照男 and Itoh, K},
 issue = {1},
 journal = {Physica C: Superconductivity},
 month = {Oct},
 note = {From an analysis of E–J curves with the aid of the flux creep-flow model, it is found that most of the electric field is caused by the flux creep even in the range of electric field in usual resistive measurement. This result is consistent with the fact that the mechanism of flux creep generally explains various phenomena such as the critical current density, the irreversibility field and so on. On the other hand, it is much easier to use the parameters used in the percolation flow model to describe the E–J characteristics phenomenologically. The two models are compared and it is found that the two models are consistent. This gives a theoretical proof for the parameters of the percolation flow model.},
 pages = {575--579},
 title = {Theoretical analysis of E–J characteristics in a Bi-2223 silver-sheathed tape},
 volume = {378-381},
 year = {2002},
 yomi = {オタベ, エドモンド ソウジ and キウチ, マサル and マツシタ, テルオ}
}