{"created":"2023-05-15T11:55:21.599933+00:00","id":252,"links":{},"metadata":{"_buckets":{"deposit":"d06300ea-ec83-4578-a031-c9605856fbad"},"_deposit":{"created_by":3,"id":"252","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"252"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00000252","sets":["8:9"]},"author_link":["1259","631","572","1253","1254","1257","633","1252"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2002-10-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"579","bibliographicPageStart":"575","bibliographicVolumeNumber":"378-381","bibliographic_titles":[{"bibliographic_title":"Physica C: Superconductivity"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"From an analysis of E–J curves with the aid of the flux creep-flow model, it is found that most of the electric field is caused by the flux creep even in the range of electric field in usual resistive measurement. This result is consistent with the fact that the mechanism of flux creep generally explains various phenomena such as the critical current density, the irreversibility field and so on. On the other hand, it is much easier to use the parameters used in the percolation flow model to describe the E–J characteristics phenomenologically. The two models are compared and it is found that the two models are consistent. This gives a theoretical proof for the parameters of the percolation flow model.","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"小田部","familyNameLang":"ja"},{"familyName":"オタベ","familyNameLang":"ja-Kana"},{"familyName":"Otabe","familyNameLang":"en"}],"givenNames":[{"givenName":"エドモンド 荘司","givenNameLang":"ja"},{"givenName":"エドモンド ソウジ","givenNameLang":"ja-Kana"},{"givenName":"Edmund 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and Electronics, Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology, 680-4 Kawazu, Iizuka 820-8502, Japan"},{"subitem_text_value":"Department of Electrical and Electronic Systems Engineering, Graduate School of Information Science and Electrical Engineering, Kyushu University, 6-10-1 Hakozaki, Higashi-ku, Fukuoka 812-8581, Japan"},{"subitem_text_value":"Department of Electrical and Electronic Systems Engineering, Graduate School of Information Science and Electrical Engineering, Kyushu University, 6-10-1 Hakozaki, Higashi-ku, Fukuoka 812-8581, Japan"},{"subitem_text_value":"Department of Computer Science and Electronics, Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology, 680-4 Kawazu, Iizuka 820-8502, Japan"},{"subitem_text_value":"National Institute for Materials Science, 1-2-1 Sengen, Tsukuba 305-0047, 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