{"created":"2023-05-15T11:55:21.846512+00:00","id":258,"links":{},"metadata":{"_buckets":{"deposit":"c11b64ec-acc4-4734-9ba8-690f9e196d09"},"_deposit":{"created_by":3,"id":"258","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"258"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00000258","sets":["8:9"]},"author_link":["1295","1297","572","1296","633"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1990-10-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"5-6","bibliographicPageEnd":"382","bibliographicPageStart":"375","bibliographicVolumeNumber":"170","bibliographic_titles":[{"bibliographic_title":"Physica C: Superconductivity"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The DC susceptibility of oxide superconducting specimens in the field-cooled process has been experimentally found to depend not only on the applied DC magnetic field but also on the size of the specimens. The DC susceptibility is calculated using the critical state model in which the diamagnetism and the flux-pinning effect of superconductors are taken into account. It is shown that the saturated value of the DC susceptibility at sufficiently low temperatures, i.e., the so-called Meissner fraction, decreases with increasing DC field and/or increasing specimen size.","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Matsushita","familyNameLang":"en"},{"familyName":"松下","familyNameLang":"ja"},{"familyName":"マツシタ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Teruo","givenNameLang":"en"},{"givenName":"照男","givenNameLang":"ja"},{"givenName":"テルオ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"633","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"90038084","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000090038084"},{"nameIdentifier":"7402307429","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7402307429"}],"names":[{"name":"Matsushita, Teruo","nameLang":"en"},{"name":"松下, 照男","nameLang":"ja"},{"name":"マツシタ, テルオ","nameLang":"ja-Kana"}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"小田部","familyNameLang":"ja"},{"familyName":"オタベ","familyNameLang":"ja-Kana"},{"familyName":"Otabe","familyNameLang":"en"}],"givenNames":[{"givenName":"エドモンド 荘司","givenNameLang":"ja"},{"givenName":"エドモンド ソウジ","givenNameLang":"ja-Kana"},{"givenName":"Edmund Soji","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"572","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"30231236","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000030231236"},{"nameIdentifier":"7003400054","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7003400054"},{"nameIdentifier":"0000-0001-9880-8240","nameIdentifierScheme":"ORCiD","nameIdentifierURI":"https://orcid.org/0000-0001-9880-8240"},{"nameIdentifier":"205","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/205_ja.html"}],"names":[{"name":"小田部, エドモンド 荘司","nameLang":"ja"},{"name":"オタベ, エドモンド ソウジ","nameLang":"ja-Kana"},{"name":"Otabe, Edmund Soji","nameLang":"en"}]}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Elsevier"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1016/0921-4534(90)90003-W","subitem_relation_type_select":"DOI"}}]},"item_21_relation_14":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"http://www.sciencedirect.com/science/journal/09214534"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.sciencedirect.com/science/journal/09214534","subitem_relation_type_select":"URI"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © 1990 Published by Elsevier Science B.V."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0921-4534","subitem_source_identifier_type":"ISSN"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Department of Computer Science and Electronics, Kyushu Institute of Technology, 680-4 Kawazu, Iizuka 820, Japan"},{"subitem_text_value":"Department of Computer Science and Electronics, Kyushu Institute of Technology, 680-4 Kawazu, Iizuka 820, Japan"},{"subitem_text_value":"Department of Electronics, Kyushu University, 6-10-1 Kakozaki, Higashi-ku, Fukuoka 812, Japan"},{"subitem_text_value":"Superconductivity Research Laboratory, International Superconductivity Technology Center, 1-10-13 Shinonome, Koto-ku, Tokyo 135, Japan"},{"subitem_text_value":"Department of Industrial Chemistry, University of Tokyo 7-3-1 Hongo, Bunkyo-ku, Tokyo 113, Japan"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Matsushita, Teruo","creatorNameLang":"en"},{"creatorName":"松下, 照男","creatorNameLang":"ja"},{"creatorName":"マツシタ, テルオ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"小田部, エドモンド 荘司","creatorNameLang":"ja"},{"creatorName":"オタベ, エドモンド ソウジ","creatorNameLang":"ja-Kana"},{"creatorName":"Otabe, Edmund Soji","creatorNameLang":"en"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{},{}]},{"creatorNames":[{"creatorName":"Matsuno, T"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Murakami, M"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kitazawa, K"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2007-12-11"}],"displaytype":"detail","filename":"0921-4534(90)90003-W.pdf","filesize":[{"value":"128.0 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"0921-4534(90)90003-W.pdf","url":"https://kyutech.repo.nii.ac.jp/record/258/files/0921-4534(90)90003-W.pdf"},"version_id":"b2c222ec-8ba2-4b2b-8327-2f50ce06548f"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"DC susceptibility of type-II superconductors in field-cooled processes","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"DC susceptibility of type-II superconductors in field-cooled processes"}]},"item_type_id":"21","owner":"3","path":["9"],"pubdate":{"attribute_name":"公開日","attribute_value":"2007-12-11"},"publish_date":"2007-12-11","publish_status":"0","recid":"258","relation_version_is_last":true,"title":["DC susceptibility of type-II superconductors in field-cooled processes"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2024-04-02T08:35:08.933533+00:00"}