{"created":"2023-05-15T11:55:22.732894+00:00","id":280,"links":{},"metadata":{"_buckets":{"deposit":"96f8bcad-37c5-4bdc-8f17-4ea95cb81f30"},"_deposit":{"created_by":3,"id":"280","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"280"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00000280","sets":["15:20"]},"author_link":["1394","1395","6416","1145","926","1399"],"control_number":"280","item_23_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005-12","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"8","bibliographicPageStart":"1","bibliographic_titles":[{"bibliographic_title":"12th Asia-Pacific Software Engineering Conference (APSEC'05)","bibliographic_titleLang":"en"}]}]},"item_23_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This paper describes an analysis method with failure scenario matrix for specifying unexpected obstacles in order to improve the quality of embedded systems. Although embedded software has become increasingly large in scale and complexity, companies are requiring the software to be developed within shorter periods of time. Therefore, the quality of the software is bound to suffer. This problem is one of the most serious concerns in a coming age of ubiquitous embedded systems. In order to improve the quality, it is very important to specify the forbidden behavior of embedded systems. The forbidden behavior of unexpected obstacles is analyzed by using a matrix and scenarios. This paper provides a detailed description of the analysis method used, in particular the cause, phenomenon, and goal in the scenario, relating them to each other by using a matrix.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_23_description_5":{"attribute_name":"備考","attribute_value_mlt":[{"subitem_description":"Proceedings of the 12th Asia-Pacific Software Engineering Conference, December 15-17, 2005, The Grand Hotel in Taiwan","subitem_description_type":"Other"}]},"item_23_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Conference Paper","subitem_description_type":"Other"}]},"item_23_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"lang":"ja"}]}]}]},"item_23_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_23_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/APSEC.2005.30","subitem_relation_type_select":"DOI"}}]},"item_23_relation_9":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"0-7695-2465-6","subitem_relation_type_select":"ISBN"}}]},"item_23_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"©2005 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE."}]},"item_23_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_23_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1530-1362","subitem_source_identifier_type":"PISSN"}]},"item_23_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Mise, Toshiro","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shinyashiki, Yasufumi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Hashimoto, Masaaki","creatorNameLang":"en"},{"creatorName":"橋本, 正明","creatorNameLang":"ja"},{"creatorName":"ハシモト, マサアキ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{}]},{"creatorAffiliations":[{"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Ubayashi, Naoyasu","creatorNameLang":"en"},{"creatorName":"鵜林, 尚靖","creatorNameLang":"ja"},{"creatorName":"ウバヤシ, ナオヤス","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Katamine, Keiichi","creatorNameLang":"en"},{"creatorName":"片峯, 恵一","creatorNameLang":"ja"},{"creatorName":"カタミネ, ケイイチ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Nakatani, Takako","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2007-12-18"}],"displaytype":"detail","filename":"24650447.pdf","filesize":[{"value":"221.7 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"24650447.pdf","url":"https://kyutech.repo.nii.ac.jp/record/280/files/24650447.pdf"},"version_id":"8580715a-85df-4814-b320-4b4e788d3eb1"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"An analysis method with failure scenario matrix for specifying unexpected obstacles in embedded systems","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"An analysis method with failure scenario matrix for specifying unexpected obstacles in embedded systems","subitem_title_language":"en"}]},"item_type_id":"23","owner":"3","path":["20"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2007-12-18"},"publish_date":"2007-12-18","publish_status":"0","recid":"280","relation_version_is_last":true,"title":["An analysis method with failure scenario matrix for specifying unexpected obstacles in embedded systems"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2024-02-19T04:38:55.425955+00:00"}