@article{oai:kyutech.repo.nii.ac.jp:00000293,
 author = {Kuwabara, Nobuo and 桑原, 伸夫 and Koga, H and Motomitsu, T},
 issue = {3},
 journal = {IEEE Transactions on Electromagnetic Compatibility},
 month = {Aug},
 note = {The development of a lightning surge test circuit that can predict malfunctions in telecommunications equipment is reported. The test circuit was developed using the equivalent impedance of telecommunication line and a voltage source that generates the test surge. The test surge waveform is determined from observed lightning surge data in Japan based on the equipment malfunction rate. In experiments using a key telephone switching system, the malfunction rates predicted by the test are shown to agree closely with observed rates},
 pages = {393--400},
 title = {A New Lightning Surge Test Circuit for Telecommunications Equipment in Japan},
 volume = {30},
 year = {1988},
 yomi = {クワバラ, ノブオ}
}