{"created":"2023-05-15T11:55:23.260713+00:00","id":293,"links":{},"metadata":{"_buckets":{"deposit":"b8b7baf8-b712-4f0d-b57e-e5f7ff185103"},"_deposit":{"created_by":3,"id":"293","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"293"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00000293","sets":["8:24"]},"author_link":["1468","1469","31450"],"control_number":"293","item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1988-08","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"3","bibliographicPageEnd":"400","bibliographicPageStart":"393","bibliographicVolumeNumber":"30","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Electromagnetic Compatibility"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The development of a lightning surge test circuit that can predict malfunctions in telecommunications equipment is reported. The test circuit was developed using the equivalent impedance of telecommunication line and a voltage source that generates the test surge. The test surge waveform is determined from observed lightning surge data in Japan based on the equipment malfunction rate. In experiments using a key telephone switching system, the malfunction rates predicted by the test are shown to agree closely with observed rates","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Kuwabara","familyNameLang":"en"},{"familyName":"桑原","familyNameLang":"ja"},{"familyName":"クワバラ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Nobuo","givenNameLang":"en"},{"givenName":"伸夫","givenNameLang":"ja"},{"givenName":"ノブオ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"31450","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"7005750067","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7005750067"}],"names":[{"name":"Kuwabara, Nobuo","nameLang":"en"},{"name":"桑原, 伸夫","nameLang":"ja"},{"name":"クワバラ, ノブオ","nameLang":"ja-Kana"}]}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Institute of Electrical and Electronics Engineers"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1109/15.3320","subitem_relation_type_select":"DOI"}}]},"item_21_relation_66":{"attribute_name":"論文ID（NAID）","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"120002440721","subitem_relation_type_select":"NAID"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"©1988 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_10":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA0066781X","subitem_source_identifier_type":"NCID"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0018-9375","subitem_source_identifier_type":"PISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"541","subitem_subject_scheme":"NDC"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Electr. Commun. Lab., NTT, Ibaraki （Kyushu Institute of Technology, Tobataku-Kitakyushu 804-8550, Japan）"},{"subitem_text_value":"Electr. Commun. Lab., NTT, Ibaraki, Japan"},{"subitem_text_value":"Electr. Commun. Lab., NTT, Ibaraki, Japan"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kuwabara, Nobuo","creatorNameLang":"en"},{"creatorName":"桑原, 伸夫","creatorNameLang":"ja"},{"creatorName":"クワバラ, ノブオ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"Koga, H","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Motomitsu, T","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2007-12-20"}],"displaytype":"detail","filename":"SCN_20071220141905_001.pdf","filesize":[{"value":"2.2 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"SCN_20071220141905_001.pdf","url":"https://kyutech.repo.nii.ac.jp/record/293/files/SCN_20071220141905_001.pdf"},"version_id":"9a4cd386-072d-4390-a4c4-af6c3516b391"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"A New Lightning Surge Test Circuit for Telecommunications Equipment in Japan","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"A New Lightning Surge Test Circuit for Telecommunications Equipment in Japan","subitem_title_language":"en"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2007-12-20"},"publish_date":"2007-12-20","publish_status":"0","recid":"293","relation_version_is_last":true,"title":["A New Lightning Surge Test Circuit for Telecommunications Equipment in Japan"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-10-25T09:49:46.397208+00:00"}