{"created":"2023-05-15T11:55:23.342425+00:00","id":295,"links":{},"metadata":{"_buckets":{"deposit":"2e51754f-2d44-4e1f-a519-ec28bb1d79c7"},"_deposit":{"created_by":3,"id":"295","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"295"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00000295","sets":["8:9"]},"author_link":["1476","1138"],"control_number":"295","item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2007-04-17","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"16","bibliographicPageEnd":"161109-3","bibliographicPageStart":"161109-1","bibliographicVolumeNumber":"90","bibliographic_titles":[{"bibliographic_title":"Applied Physics Letters"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Photoluminescence (PL) properties of a blue In0.3Ga0.7N multiple-quantum-well (MQW) diode with an additional n+-doped In0.18Ga0.82N electron reservoir layer (ERL) have been investigated at 20  K as a function of reverse bias under indirect barrier excitation. A PL intensity ratio of MQW/ERL is observed to be significantly quenched by increasing the reverse field due to electron-hole separation and carrier escape, in spite of observed blueshifts, when the excitation power is decreased by two orders of magnitude. The PL intensity reduction suggests that the hole escape process plays an important role for determination of the PL efficiency under the reverse bias.","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal 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ケンゾウ","nameLang":"ja-Kana"}]}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"American Institute of 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Physics"}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_10":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00543431","subitem_source_identifier_type":"NCID"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0003-6951","subitem_source_identifier_type":"PISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"427","subitem_subject_scheme":"NDC"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology, Tobata, Kitakyushu 804-8550, Japan"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Inoue, T","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Fujiwara, Kenzo","creatorNameLang":"en"},{"creatorName":"藤原, 賢三","creatorNameLang":"ja"},{"creatorName":"フジワラ, ケンゾウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2007-12-20"}],"displaytype":"detail","filename":"67.pdf","filesize":[{"value":"305.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"67.pdf","url":"https://kyutech.repo.nii.ac.jp/record/295/files/67.pdf"},"version_id":"445c1c10-2361-4a2a-9f95-54272a51bacf"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"indium compounds","subitem_subject_scheme":"Other"},{"subitem_subject":"gallium compounds","subitem_subject_scheme":"Other"},{"subitem_subject":"III-V semiconductors","subitem_subject_scheme":"Other"},{"subitem_subject":"wide band gap semiconductors","subitem_subject_scheme":"Other"},{"subitem_subject":"quantum well devices","subitem_subject_scheme":"Other"},{"subitem_subject":"semiconductor diodes","subitem_subject_scheme":"Other"},{"subitem_subject":"photoluminescence","subitem_subject_scheme":"Other"},{"subitem_subject":"spectral line shift","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Hole escape processes detrimental to photoluminescence efficiency in a blue InGaN multiple-quantum-well diode under reverse bias conditions","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Hole escape processes detrimental to photoluminescence efficiency in a blue InGaN multiple-quantum-well diode under reverse bias conditions","subitem_title_language":"en"}]},"item_type_id":"21","owner":"3","path":["9"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2007-12-20"},"publish_date":"2007-12-20","publish_status":"0","recid":"295","relation_version_is_last":true,"title":["Hole escape processes detrimental to photoluminescence efficiency in a blue InGaN multiple-quantum-well diode under reverse bias conditions"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2024-04-02T08:36:31.470028+00:00"}