@article{oai:kyutech.repo.nii.ac.jp:00003418,
 author = {Takashiri, Masayuki and Tanaka, Saburo and Miyazaki, Koji and Tsukamoto, Hiroshi and 塚本, 寛},
 issue = {1(2)},
 journal = {Journal of Alloys and Compounds},
 month = {Feb},
 note = {The cross-plane thermal conductivity of highly oriented nanocrystalline bismuth antimony telluride thin films is investigated. The thin film was deposited by a flash evaporation method. The resulting film was oriented with the c-axis to the substrate, and was composed of fine grains with an average grain size of 150 nm. The cross-plane thermal conductivity of the film was measured by a 3ω method at room temperature, and was determined to be 0.6 W m−1 K−1. Compared to the single crystal bulk alloy of nearly the same composition and carrier concentration, the thin film exhibited a 20% reduction in the thermal conductivity.},
 pages = {L44--L47},
 title = {Cross-plane thermal conductivity of highly oriented nanocrystalline bismuth antimony telluride thin films},
 volume = {490},
 year = {2010},
 yomi = {ツカモト, ヒロシ}
}