{"created":"2023-05-15T11:57:42.210315+00:00","id":3434,"links":{},"metadata":{"_buckets":{"deposit":"0414dd1b-788f-4061-8ed6-27cdfd3621dc"},"_deposit":{"created_by":3,"id":"3434","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"3434"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00003434","sets":["8:24"]},"author_link":["1143","13768","13769","6567"],"control_number":"3434","item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2009-11","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"11","bibliographicPageEnd":"1776","bibliographicPageStart":"1767","bibliographicVolumeNumber":"28","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Yield loss caused by excessive power supply noise has become a serious problem in at-speed scan testing. Although X-filling techniques are available to reduce the launch cycle switching activity, their performance may not be satisfactory in the linear-decompressor-based test compression environment. This paper solves this problem by proposing a novel integrated automatic test pattern generation scheme that efficiently and effectively performs compressible low-capture-power X -filling. Related theoretical principles are established, based on which the problem size is substantially reduced. The proposed scheme is validated by benchmark circuits, as well as an industry design in the embedded deterministic test environment.","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"Wen","familyNameLang":"en"},{"familyName":"温","familyNameLang":"ja"},{"familyName":"オン","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Xiaoqing","givenNameLang":"en"},{"givenName":"暁青","givenNameLang":"ja"},{"givenName":"ギョウセイ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"1143","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"20250897","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000020250897"},{"nameIdentifier":"7201738030","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7201738030"},{"nameIdentifier":"300","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}],"names":[{"name":"Wen, Xiaoqing","nameLang":"en"},{"name":"温, 暁青","nameLang":"ja"},{"name":"オン, ギョウセイ","nameLang":"ja-Kana"}]}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Institute of Electrical and Electronics Engineers"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/TCAD.2009.2030440","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2009 IEEE. Personal use of this material is permitted.However,permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, ore to reuse any copyrighted component of this work in other works must be obtained from the IEEE."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0278-0070","subitem_source_identifier_type":"PISSN"}]},"item_21_text_64":{"attribute_name":"業績ID","attribute_value_mlt":[{"subitem_text_value":"99E4EE94B18A41E6492576D30007F8E5"}]},"item_21_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Wu, Meng-Fan","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Huang, Jiun-Lang","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Miyase, Kohei","creatorNameLang":"en"},{"creatorName":"宮瀬, 紘平","creatorNameLang":"ja"},{"creatorName":"ミヤセ, コウヘイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2010-02-25"}],"displaytype":"detail","filename":"powerSuppiy.pdf","filesize":[{"value":"797.0 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"powerSuppiy.pdf","url":"https://kyutech.repo.nii.ac.jp/record/3434/files/powerSuppiy.pdf"},"version_id":"d7212250-5149-4dc9-961b-af743b77a789"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment","subitem_title_language":"en"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2010-02-25"},"publish_date":"2010-02-25","publish_status":"0","recid":"3434","relation_version_is_last":true,"title":["Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-10-25T08:56:53.225036+00:00"}