{"created":"2023-05-15T11:55:25.909890+00:00","id":354,"links":{},"metadata":{"_buckets":{"deposit":"0a7076b6-4f4d-4df4-913a-5d27571757b8"},"_deposit":{"created_by":3,"id":"354","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"354"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00000354","sets":["8:24"]},"author_link":["633","1812","631","1814","1815"],"control_number":"354","item_1689815586683":{"attribute_name":"CRID","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://cir.nii.ac.jp/crid/1050564288863136384","subitem_relation_type_select":"URI"}}]},"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005-06-13","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicPageEnd":"2521","bibliographicPageStart":"2518","bibliographicVolumeNumber":"15","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Applied Superconductivity","bibliographic_titleLang":"en"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The critical current property of a superconducting Bi-2223 tape produced by the over pressure processing at the final heat treatment was investigated. The critical current density increased by a factor of 1.6-1.8 at 77.3 K in comparison with the tape produced by the usual process. Thus, the critical current increased in spite of a reduction in the filament thickness. It was also found that the irreversibility field increased by a factor of 1.34 at 77.3 K by the new process. As a result, the enhancement of the critical current density at higher fields is remarkable. These results suggest that the over pressure process not only enriches the mass concentration of the superconducting phase but also contributes to the c-axis alignment. This is supported directly by the reduction of FWHM of rocking curve and indirectly by an enhancement the n value. The critical current property at lower temperatures is also investigated and the possibility of the further improvement of the property is discussed.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_21_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"Institute of Electrical and Electronics Engineers","subitem_publisher_language":"en"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/TASC.2005.847512","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"©2005 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_10":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_source_identifier":"AA10791666","subitem_source_identifier_type":"NCID"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1051-8223","subitem_source_identifier_type":"PISSN"},{"subitem_source_identifier":"1558-2515","subitem_source_identifier_type":"EISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"541","subitem_subject_scheme":"NDC"}]},"item_21_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNames":[{}]}],"creatorNames":[{"creatorName":"Matsushita, Teruo","creatorNameLang":"en"},{"creatorName":"松下, 照男","creatorNameLang":"ja"},{"creatorName":"マツシタ, テルオ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{}]},{"creatorNames":[{"creatorName":"Himeda, Y","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNames":[{}]}],"creatorNames":[{"creatorName":"Kiuchi, Masaru","creatorNameLang":"en"},{"creatorName":"木内, 勝","creatorNameLang":"ja"},{"creatorName":"キウチ, マサル","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Fujikami, J","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hayashi, K","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2008-01-07"}],"displaytype":"detail","filename":"SCN_20071227161808_001.pdf","filesize":[{"value":"929.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"SCN_20071227161808_001.pdf","url":"https://kyutech.repo.nii.ac.jp/record/354/files/SCN_20071227161808_001.pdf"},"version_id":"c637be1b-9000-4ac7-b795-35a9b08bdbb0"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Characterization of critical current density in silver-sheathed Bi-2223 tape","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Characterization of critical current density in silver-sheathed Bi-2223 tape","subitem_title_language":"en"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2008-01-07"},"publish_date":"2008-01-07","publish_status":"0","recid":"354","relation_version_is_last":true,"title":["Characterization of critical current density in silver-sheathed Bi-2223 tape"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2024-04-25T07:37:27.239895+00:00"}