@article{oai:kyutech.repo.nii.ac.jp:00003567,
 author = {Takashiri, Masayuki and Tanaka, Saburo and Miyazaki, Koji and 宮崎, 康次},
 issue = {2},
 journal = {Thin Solid Films},
 month = {Nov},
 note = {Improved thermoelectric performance of highly-oriented nanocrystalline bismuth antimony telluride thin films is described. The thin films are deposited by a flash evaporation method, followed by annealing in hydrogen. By optimizing the annealing conditions, the resulting thin films exhibit almost perfect orientation with the c-axis normal to the substrate, and are composed of nano-sized grains with an average grain size of 150 nm. The in-plane electrical conductivity and Seebeck coefficient were measured at room temperature. The cross-plane thermal conductivity of the thin films was measured by a 3ω method, and the in-plane thermal conductivity was evaluated by using an anisotropic factor of thermal conductivity based on a single crystal bulk alloy with almost the same composition and carrier concentration. The measured cross-plane thermal conductivity is 0.56 W/(m K), and the in-plane thermal conductivity is evaluated to be 1.05 W/(m K). Finally, the in-plane power factor and figure-of-merit, ZT, of the thin films are 35.6 μW/(cm K2) and 1.0 at 300 K, respectively.},
 pages = {619--624},
 title = {Improved thermoelectric performance of highly-oriented nanocrystalline bismuth antimony telluride thin films},
 volume = {519},
 year = {2010},
 yomi = {ミヤザキ, コウジ}
}